Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
AS

Alexander T. Schwarm — 33 Patents

Applied Materials: 30 patents #374 of 7,310Top 6%
TBThe Dun & Bradstreet: 3 patents #12 of 164Top 8%
Austin, TX: #894 of 18,064 inventorsTop 5%
Texas: #3,395 of 125,132 inventorsTop 3%
Overall (All Time): #105,480 of 4,157,543Top 3%
33 Patents All Time
Alexander T. Schwarm has been granted 33 US patents while listed as an inventor at Applied Materials. The first was granted in 2005 and the most recent in May 2023. Alexander T. Schwarm ranks #105,480 of 4,157,543 US inventors in our database (top 2.5%). Patent records list Alexander T. Schwarm in Austin, TX, US.

Issued Patents All Time

Showing 1–25 of 33 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
11651253 Machine learning classifier for identifying internet service providers from website tracking Lavina Choudhary, James Beveridge, Anudit Vikram 2023-05-16 $268,255,000
11386336 Machine learning classifier and prediction engine for artificial intelligence optimized prospect determination on win/loss classification James Beveridge, Nalanda Matia, Granger Huntress, Bradley D. White, Karolina Kierzkowski +1 more 2022-07-12 $112,770,000
11238233 Artificial intelligence engine for generating semantic directions for websites for automated entity targeting to mapped identities James Beveridge, Dane Anthony Macaulay, Anudit Vikram 2022-02-01 $253,978,000
8924904 Method and apparatus for determining factors for design consideration in yield analysis Vicky Svidenko, Youval Nehmadi, Rinat Shimshi, Sundar Jawaharlah 2014-12-30 $17,286,000
8849438 Factory level process and final product performance control system Suketu Arun Parikh, Sanjiv Mittal, Charles Gay 2014-09-30 $12,856,000
8799831 Inline defect analysis for sampling and SPC Youval Nehmadi, Rinat Shimshi, Vicky Svidenko, Sundar Jawaharlal 2014-08-05 $16,131,000
8694145 Feedback control of a chemical mechanical polishing device providing manipulation of removal rate profiles Arulkumar Shanmugasundram, Gopalakrishna B. Prabhu 2014-04-08 $11,783,000
8483861 Scheduling modeling system for adaptive, automated data collection and performance analysis of manufacturing system for optimal scheduling 2013-07-09 $18,699,000
8070909 Feedback control of chemical mechanical polishing device providing manipulation of removal rate profiles Arulkumar Shanmugasundram, Gopalakrishna B. Prabhu 2011-12-06 $11,052,000
8010321 Metrics independent and recipe independent fault classes Y. Sean Lin, William Clements 2011-08-30 $11,098,000
7970588 Method, system and medium for controlling manufacturing process using adaptive models based on empirical data Yuri Kokotov, Efim Entin, Jacques Seror, Jehuda Hartman, Yossi Fisher +2 more 2011-06-28 $3,915,000
7966087 Method, system and medium for controlling manufacture process having multivariate input parameters Yuri Kokotov, Efim Entin, Jacques Seror, Yossi Fisher, Shalomo Sarel +2 more 2011-06-21 $5,178,000
7962864 Stage yield prediction Youval Nehmadi, Rinat Shimshi, Vicky Svidenko, Sundar Jawaharlal 2011-06-14 $10,682,000
7937179 Dynamic inline yield analysis and prediction of a defect limited yield using inline inspection defects Rinat Shimshi, Youval Nehmadi, Vicky Svidenko, Sundar Jawaharlal 2011-05-03 $18,491,000
7934125 Ranged fault signatures for fault diagnosis Jerry Harvey 2011-04-26 $30,342,000
7831326 Graphical user interface for presenting multivariate fault contributions Y. Sean Lin 2010-11-09 $8,686,000
7783375 Dynamic metrology schemes and sampling schemes for advanced process control in semiconductor processing Arulkumar Shanmugasundram 2010-08-24 $4,612,000
7765020 Graphical user interface for presenting multivariate fault contributions Y. Sean Lin 2010-07-27 $15,482,000
7725208 Dynamic metrology schemes and sampling schemes for advanced process control in semiconductor processing Arulkumar Shanmugasundram 2010-05-25 $16,074,000
7698012 Dynamic metrology schemes and sampling schemes for advanced process control in semiconductor processing Arulkumar Shanmugasundram 2010-04-13 $8,039,000
7668702 Method, system and medium for controlling manufacturing process using adaptive models based on empirical data Yuri Kokotov, Efim Entin, Jacques Seror, Jehuda Hartman, Yossi Fisher +2 more 2010-02-23 $23,348,000
7596718 Ranged fault signatures for fault diagnosis Jerry Harvey 2009-09-29 $29,132,000
7587296 Adaptive multivariate fault detection Jerry Harvey 2009-09-08 $12,578,000
7356377 System, method, and medium for monitoring performance of an advanced process control system 2008-04-08 $17,034,000
7337019 Integration of fault detection with run-to-run control Terry Reiss, Arulkumar Shanmugasundram 2008-02-26 $21,345,000