Issued Patents All Time
Showing 25 most recent of 33 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11651253 | Machine learning classifier for identifying internet service providers from website tracking | Lavina Choudhary, James Beveridge, Anudit Vikram | 2023-05-16 |
| 11386336 | Machine learning classifier and prediction engine for artificial intelligence optimized prospect determination on win/loss classification | James Beveridge, Nalanda Matia, Granger Huntress, Bradley D. White, Karolina Kierzkowski +1 more | 2022-07-12 |
| 11238233 | Artificial intelligence engine for generating semantic directions for websites for automated entity targeting to mapped identities | James Beveridge, Dane Anthony Macaulay, Anudit Vikram | 2022-02-01 |
| 8924904 | Method and apparatus for determining factors for design consideration in yield analysis | Vicky Svidenko, Youval Nehmadi, Rinat Shimshi, Sundar Jawaharlah | 2014-12-30 |
| 8849438 | Factory level process and final product performance control system | Suketu Arun Parikh, Sanjiv Mittal, Charles Gay | 2014-09-30 |
| 8799831 | Inline defect analysis for sampling and SPC | Youval Nehmadi, Rinat Shimshi, Vicky Svidenko, Sundar Jawaharlal | 2014-08-05 |
| 8694145 | Feedback control of a chemical mechanical polishing device providing manipulation of removal rate profiles | Arulkumar Shanmugasundram, Gopalakrishna B. Prabhu | 2014-04-08 |
| 8483861 | Scheduling modeling system for adaptive, automated data collection and performance analysis of manufacturing system for optimal scheduling | — | 2013-07-09 |
| 8070909 | Feedback control of chemical mechanical polishing device providing manipulation of removal rate profiles | Arulkumar Shanmugasundram, Gopalakrishna B. Prabhu | 2011-12-06 |
| 8010321 | Metrics independent and recipe independent fault classes | Y. Sean Lin, William Clements | 2011-08-30 |
| 7970588 | Method, system and medium for controlling manufacturing process using adaptive models based on empirical data | Yuri Kokotov, Efim Entin, Jacques Seror, Jehuda Hartman, Yossi Fisher +2 more | 2011-06-28 |
| 7966087 | Method, system and medium for controlling manufacture process having multivariate input parameters | Yuri Kokotov, Efim Entin, Jacques Seror, Yossi Fisher, Shalomo Sarel +2 more | 2011-06-21 |
| 7962864 | Stage yield prediction | Youval Nehmadi, Rinat Shimshi, Vicky Svidenko, Sundar Jawaharlal | 2011-06-14 |
| 7937179 | Dynamic inline yield analysis and prediction of a defect limited yield using inline inspection defects | Rinat Shimshi, Youval Nehmadi, Vicky Svidenko, Sundar Jawaharlal | 2011-05-03 |
| 7934125 | Ranged fault signatures for fault diagnosis | Jerry Harvey | 2011-04-26 |
| 7831326 | Graphical user interface for presenting multivariate fault contributions | Y. Sean Lin | 2010-11-09 |
| 7783375 | Dynamic metrology schemes and sampling schemes for advanced process control in semiconductor processing | Arulkumar Shanmugasundram | 2010-08-24 |
| 7765020 | Graphical user interface for presenting multivariate fault contributions | Y. Sean Lin | 2010-07-27 |
| 7725208 | Dynamic metrology schemes and sampling schemes for advanced process control in semiconductor processing | Arulkumar Shanmugasundram | 2010-05-25 |
| 7698012 | Dynamic metrology schemes and sampling schemes for advanced process control in semiconductor processing | Arulkumar Shanmugasundram | 2010-04-13 |
| 7668702 | Method, system and medium for controlling manufacturing process using adaptive models based on empirical data | Yuri Kokotov, Efim Entin, Jacques Seror, Jehuda Hartman, Yossi Fisher +2 more | 2010-02-23 |
| 7596718 | Ranged fault signatures for fault diagnosis | Jerry Harvey | 2009-09-29 |
| 7587296 | Adaptive multivariate fault detection | Jerry Harvey | 2009-09-08 |
| 7356377 | System, method, and medium for monitoring performance of an advanced process control system | — | 2008-04-08 |
| 7337019 | Integration of fault detection with run-to-run control | Terry Reiss, Arulkumar Shanmugasundram | 2008-02-26 |