Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11423529 | Determination of defect location for examination of a specimen | Doron Girmonsky, Boaz Cohen, Dror Shemesh | 2022-08-23 |
RA
Rafael Ben Ami — 1 Patent
Overall (All Time): #2,675,203 of 4,157,543Top 65%
1
Patents All Time