Issued Patents All Time
Showing 26–30 of 30 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10832092 | Method of generating a training set usable for examination of a semiconductor specimen and system thereof | Ohad Shaubi, Assaf Asbag | 2020-11-10 |
| 10605745 | Guided inspection of a semiconductor wafer based on systematic defects | Yotam Sofer, Saar Shabtay, Eli Buchman | 2020-03-31 |
| 9927375 | System and method for printability based inspection | Shay Attal, Ori Petel, Sergey Latinsky, Sergey Khristo | 2018-03-27 |
| 9904995 | System and method for patch based inspection | Leonid Karlinsky, Moshe Rosenweig | 2018-02-27 |
| 9568283 | Enclosure protecting system and method | Alon Brill, Ron Genussov | 2017-02-14 |