Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12400319 | Defect examination on a semiconductor specimen | Yehonatan Hai Ofir, Ran BADANES, Boris Sherman, Boaz Cohen | 2025-08-26 |
YR
Yehonatan Ridelman
Overall (All Time): #2,451,897 of 4,157,543Top 60%
1
Patents All Time