Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12423800 | Machine learning based defect examination for semiconductor specimens | Yehonatan Hai Ofir, Ran BADANES, Boris Sherman | 2025-09-23 |
YS
Yotam Nissim Ben Shoshan
Overall (All Time): #2,461,914 of 4,157,543Top 60%
1
Patents All Time