YD

Yehuda Udy Danino

Applied Materials: 1 patents #4,780 of 7,310Top 70%
📍 Bnei Brak, IL: #48 of 115 inventorsTop 45%
Overall (All Time): #3,005,162 of 4,157,543Top 75%
1
Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9367911 Apparatus and method for defect detection including patch-to-patch comparisons Michele Dalla-Torre, Boris Sherman, Zion Hadad, Noga Bullkich 2016-06-14