Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10395362 | Contour based defect detection | Ajay Gupta, Mohan Mahadevan, Sankar Venkataraman, Hedong Yang, Laurent Karsenti +2 more | 2019-08-27 |
| 9367911 | Apparatus and method for defect detection including patch-to-patch comparisons | Michele Dalla-Torre, Boris Sherman, Zion Hadad, Yehuda Udy Danino | 2016-06-14 |