Issued Patents All Time
Showing 26–40 of 40 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7663768 | Method and system for measuring patterned structures | Moshe Finarov | 2010-02-16 |
| 7626711 | Method and system for measuring patterned structures | Moshe Finarov | 2009-12-01 |
| 7626710 | Method and system for measuring patterned structures | Moshe Finarov | 2009-12-01 |
| 7495782 | Method and system for measuring patterned structures | Moshe Finarov | 2009-02-24 |
| 7477405 | Method and system for measuring patterned structures | Moshe Finarov | 2009-01-13 |
| 7301163 | Lateral shift measurement using an optical technique | Moshe Finarov, David Schiener | 2007-11-27 |
| 7292335 | Optical measurements of patterned structures | Shachar Gov | 2007-11-06 |
| 7292341 | Optical system operating with variable angle of incidence | Moshe Finarov, David Scheiner | 2007-11-06 |
| 7184152 | Optical measurements of line edge roughness | — | 2007-02-27 |
| 7122817 | Lateral shift measurement using an optical technique | Moshe Finarov, David Schiener | 2006-10-17 |
| 6974962 | Lateral shift measurement using an optical technique | Moshe Finarov, David Scheiner | 2005-12-13 |
| 6704920 | Process control for micro-lithography | Yoel Cohen | 2004-03-09 |
| 6657736 | Method and system for measuring patterned structures | Moshe Finarov | 2003-12-02 |
| 6650424 | Method and system for measuring in patterned structures | Moshe Finarov | 2003-11-18 |
| 5233903 | Gun with combined operation by chemical propellant and plasma | David Saphier, Shlomo Wald, Joseph Ashkenazi, Zvi Kaplan | 1993-08-10 |