YC

Yoel Cohen

NI Nova Measuring Instruments: 19 patents #5 of 108Top 5%
AT Adom, Advanced Optical Technologies: 15 patents #2 of 8Top 25%
Overall (All Time): #95,653 of 4,157,543Top 3%
35
Patents All Time

Issued Patents All Time

Showing 26–35 of 35 patents

Patent #TitleCo-InventorsDate
7525634 Monitoring apparatus and method particularly useful in photolithographically Giora Dishon, Moshe Finarov, Zvi Nirel 2009-04-28
7327476 Thin films measurement method and system Moshe Finarov, Klara Vinokur 2008-02-05
7289190 Monitoring apparatus and method particularly useful in photolithographically Giora Dishon, Moshe Finarov, Zvi Nirel 2007-10-30
7030957 Monitoring apparatus and method particularly useful in photolithographically processing substrates Giora Dishon, Moshe Finarov, Zvi Nirel 2006-04-18
6842220 Monitoring apparatus and method particularly useful in photolithographically processing substrates Giora Dishon, Moshe Finarov, Zvi Nirel 2005-01-11
6720568 Method and system for optical inspection of a structure formed with a surface relief Moshe Finarov 2004-04-13
6704920 Process control for micro-lithography Boaz Brill 2004-03-09
6643017 Method and system for controlling the photolithography process Moshe Finarov 2003-11-04
6424417 Method and system for controlling the photolithography process Moshe Finarov 2002-07-23
6166801 Monitoring apparatus and method particularly useful in photolithographically processing substrates Giora Dishon, Moshe Finarov, Zvi Nirel 2000-12-26