Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12223641 | Defect detection of a semiconductor specimen | Boaz Dudovich, Assaf Ariel, Amir Bar, Lior Yehieli, Chen Itzikowitz +3 more | 2025-02-11 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12223641 | Defect detection of a semiconductor specimen | Boaz Dudovich, Assaf Ariel, Amir Bar, Lior Yehieli, Chen Itzikowitz +3 more | 2025-02-11 |