RH

Robert Hannon

IBM: 42 patents #2,200 of 70,183Top 4%
CA Carborundum: 2 patents #26 of 126Top 25%
Overall (All Time): #60,857 of 4,157,543Top 2%
47
Patents All Time

Issued Patents All Time

Showing 25 most recent of 47 patents

Patent #TitleCo-InventorsDate
10170337 Implant after through-silicon via (TSV) etch to getter mobile ions Christopher N. Collins, Mukta G. Farooq, Troy L. Graves-Abe, Brian J. Greene, Herbert L. Ho +1 more 2019-01-01
9642346 Fishing line guide system 2017-05-09
9406561 Three dimensional integrated circuit integration using dielectric bonding first and through via formation last Mukta G. Farooq, Subramanian S. Iyer, Emily R. Kinser 2016-08-02
D726866 Fishing line guide 2015-04-14
8962448 Computer readable medium encoded with a program for fabricating 3D integrated circuit device using interface wafer as permanent carrier Mukta G. Farooq, Subramanian S. Iyer, Steven J. Koester, Fei Liu, Sampath Purushothaman +2 more 2015-02-24
8921198 Method and structure for forming a deep trench capacitor Roger A. Booth, Jr., Kangguo Cheng, Ravi M. Todi, Geng Wang 2014-12-30
8822141 Front side wafer ID processing Mukta G. Farooq, Subramanian S. Iyer, Kevin S. Petrarca, Stuart A. Sieg 2014-09-02
8738167 3D integrated circuit device fabrication with precisely controllable substrate removal Mukta G. Farooq, Subramanian S. Iyer, Steven J. Koester, Sampath Purushothaman, Roy R. Yu 2014-05-27
8679971 Metal-contamination-free through-substrate via structure Mukta G. Farooq, Richard P. Volant 2014-03-25
8664081 Method for fabricating 3D integrated circuit device using interface wafer as permanent carrier Mukta G. Farooq, Subramanian S. Iyer, Steven J. Koester, Fei Liu, Sampath Purushothaman +2 more 2014-03-04
8658535 Optimized annular copper TSV Paul S. Andry, Mukta G. Rarooq, Subramanian S. Iyer, Emily R. Kinser, Comelia K. Tsang +1 more 2014-02-25
8629553 3D integrated circuit device fabrication with precisely controllable substrate removal Mukta G. Farooq, Subramanian S. Iyer, Steven J. Koester, Sampath Purushothaman, Roy R. Yu 2014-01-14
8546961 Alignment marks to enable 3D integration Mukta G. Farooq, Troy L. Graves-Abe, Emily R. Kinser, William Francis Landers, Kevin S. Petrarca +2 more 2013-10-01
8492869 3D integrated circuit device having lower-cost active circuitry layers stacked before higher-cost active circuitry layer Mukta G. Farooq, Subramanian S. Iyer, Steven J. Koester, Fei Liu, Sampath Purushothaman +2 more 2013-07-23
8492878 Metal-contamination-free through-substrate via structure Mukta G. Farooq, Richard P. Volant 2013-07-23
8487425 Optimized annular copper TSV Paul S. Andry, Mukta G. Farooq, Subramanian S. Iyer, Emily R. Kinser, Cornelia K. Tsang +1 more 2013-07-16
D685056 Fishing line guide 2013-06-25
8455270 3D multiple die stacking Mukta G. Farooq, Subramanian S. Iyer 2013-06-04
8399336 Method for fabricating a 3D integrated circuit device having lower-cost active circuitry layers stacked before higher-cost active circuitry layer Mukta G. Farooq, Subramanian S. Iyer, Steven J. Koester, Fei Liu, Sampath Purushothaman +2 more 2013-03-19
8372725 Structures and methods of forming pre fabricated deep trench capacitors for SOI substrates Subramanian S. Iyer, Gerd Pfeiffer, Ravi M. Todi, Kevin R. Winstel 2013-02-12
8298914 3D integrated circuit device fabrication using interface wafer as permanent carrier Mukta G. Farooq, Subramanian S. Iyer, Steven J. Koester, Fei Liu, Sampath Purushothaman +2 more 2012-10-30
8129256 3D integrated circuit device fabrication with precisely controllable substrate removal Mukta G. Farooq, Subramanian S. Iyer, Steven J. Koester, Sampath Purushothaman, Roy R. Yu 2012-03-06
8076756 Structure for inhibiting back end of line damage from dicing and chip packaging interaction failures Michael Lane, Xiao Hu Liu, Thomas M. Shaw, Mukta G. Farooq, Ian D. Melville 2011-12-13
8022543 Underbump metallurgy for enhanced electromigration resistance Mukta G. Farooq, Emily R. Kinser, Ian D. Melville 2011-09-20
7955955 Using crack arrestor for inhibiting damage from dicing and chip packaging interaction failures in back end of line structures Michael Lane, Xiao Hu Liu, Thomas M. Shaw, Mukta G. Farooq, Ian D. Melville 2011-06-07