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Ionization test for electrical verification |
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Thermal modulation system and method for locating a circuit defect |
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2002-06-04 |
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Method to test devices on high performance ULSI wafers |
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2002-01-08 |
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Method for detecting power plane-to-power plane shorts and I/O net-to power plane shorts in modules and printed circuit boards |
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2001-06-05 |
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Thermal modulation system and method for locating a circuit defect such as a short or incipient open independent of a circuit geometry |
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Method and apparatus for locating power plane shorts using polarized light microscopy |
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2000-10-31 |
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Hand held telephone set with separable keyboard |
Joseph D. Rutledge, Alejandro G. Schrott, Charles P. Tresser, Robert J. von Gutfeld, Chai Wah Wu |
2000-09-05 |
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In-situ monitoring and control of conductive films by detecting changes in induced eddy currents |
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2000-06-06 |
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Rotary signal coupling for chemical mechanical polishing endpoint detection with a strasbaugh tool |
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In-situ monitoring of the change in thickness of films |
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1998-03-24 |
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Rotary signal coupling for chemical mechanical polishing endpoint detection with a westech tool |
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In-situ monitoring of conductive films on semiconductor wafers |
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1997-08-19 |
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In-situ monitoring of the change in thickness of films |
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System and method for testing and fault isolation of high density passive boards and substrates |
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1989-09-19 |
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Nonlinearity detection using fault-generated second harmonic |
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1985-01-29 |