| 7808257 |
Ionization test for electrical verification |
Christopher Cline, Edward J. Yarmchuk, Vincent A. Arena, Donald A. Merte, Thomas Picunko +4 more |
2010-10-05 |
$4,341,000 |
| 6400128 |
Thermal modulation system and method for locating a circuit defect |
Daniel Guidotti, Michael E. Scaman, Arthur R. Zingher |
2002-06-04 |
$11,648,000 |
| 6337218 |
Method to test devices on high performance ULSI wafers |
Cyprian Emeka Uzoh, Stephen A. Cohen |
2002-01-08 |
$17,918,000 |
| 6242923 |
Method for detecting power plane-to-power plane shorts and I/O net-to power plane shorts in modules and printed circuit boards |
Michael E. Scaman, Edward J. Yarmchuk |
2001-06-05 |
$46,299,000 |
| 6236196 |
Thermal modulation system and method for locating a circuit defect such as a short or incipient open independent of a circuit geometry |
Daniel Guidotti, Michael E. Scaman, Arthur R. Zingher |
2001-05-22 |
$28,959,000 |
| 6226619 |
Method and system for preventing counterfeiting of high price wholesale and retail items |
Paul A. Moskowitz, Alejandro G. Schrott, Charles P. Tresser, Robert J. von Gutfeld |
2001-05-01 |
$28,625,000 |
| 6141093 |
Method and apparatus for locating power plane shorts using polarized light microscopy |
Bernell E. Argyle, Michael E. Scaman, Edward J. Yarmchuk |
2000-10-31 |
$31,312,000 |
| 6115616 |
Hand held telephone set with separable keyboard |
Joseph D. Rutledge, Alejandro G. Schrott, Charles P. Tresser, Robert J. von Gutfeld, Chai Wah Wu |
2000-09-05 |
$37,092,000 |
| 6072313 |
In-situ monitoring and control of conductive films by detecting changes in induced eddy currents |
Leping Li, Steven G. Barbee, Tony F. Heinz |
2000-06-06 |
$33,361,000 |
| 5770948 |
Rotary signal coupling for chemical mechanical polishing endpoint detection with a strasbaugh tool |
Leping Li, Steven G. Barbee, Richard Ruggiero, William Joseph Surovie |
1998-06-23 |
$13,396,000 |
| 5731697 |
In-situ monitoring of the change in thickness of films |
Leping Li, Steven G. Barbee, Tony F. Heinz |
1998-03-24 |
$15,296,000 |
| 5663637 |
Rotary signal coupling for chemical mechanical polishing endpoint detection with a westech tool |
Leping Li, Steven G. Barbee, Gary R. Doyle, Kevin L. Holland, Francis Walter Kazak +4 more |
1997-09-02 |
$11,536,000 |
| 5660672 |
In-situ monitoring of conductive films on semiconductor wafers |
Leping Li, Steven G. Barbee, Tony F. Heinz |
1997-08-26 |
$35,141,000 |
| 5659492 |
Chemical mechanical polishing endpoint process control |
Leping Li, Steven G. Barbee |
1997-08-19 |
$11,736,000 |
| 5644221 |
Endpoint detection for chemical mechanical polishing using frequency or amplitude mode |
Leping Li, Steven G. Barbee |
1997-07-01 |
$13,721,000 |
| 5621327 |
System and method for testing and fault isolation of high density passive boards and substrates |
Shinwu Chiang, Huntington W. Curtis, Arthur E. Falls, John P. Karidis, John D. Mackay +3 more |
1997-04-15 |
$19,390,000 |
| 5559428 |
In-situ monitoring of the change in thickness of films |
Leping Li, Steven G. Barbee, Tony F. Heinz |
1996-09-24 |
$13,669,000 |
| 5402072 |
System and method for testing and fault isolation of high density passive boards and substrates |
Shinwu Chiang, Huntington W. Curtis, Arthur E. Falls, John P. Karidis, John D. Mackay +3 more |
1995-03-28 |
$14,060,000 |
| 4868506 |
Defect detection using intermodulation signals |
Thomas H. DiStefano, Arthur E. Falls, John D. Mackay |
1989-09-19 |
$10,311,000 |
| 4496900 |
Nonlinearity detection using fault-generated second harmonic |
Thomas H. Di Stefano |
1985-01-29 |
$30,131,000 |
