Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7808257 | Ionization test for electrical verification | Christopher Cline, Edward J. Yarmchuk, Vincent A. Arena, Donald A. Merte, Thomas Picunko +4 more | 2010-10-05 |
| 6400128 | Thermal modulation system and method for locating a circuit defect | Daniel Guidotti, Michael E. Scaman, Arthur R. Zingher | 2002-06-04 |
| 6337218 | Method to test devices on high performance ULSI wafers | Cyprian Emeka Uzoh, Stephen A. Cohen | 2002-01-08 |
| 6242923 | Method for detecting power plane-to-power plane shorts and I/O net-to power plane shorts in modules and printed circuit boards | Michael E. Scaman, Edward J. Yarmchuk | 2001-06-05 |
| 6236196 | Thermal modulation system and method for locating a circuit defect such as a short or incipient open independent of a circuit geometry | Daniel Guidotti, Michael E. Scaman, Arthur R. Zingher | 2001-05-22 |
| 6226619 | Method and system for preventing counterfeiting of high price wholesale and retail items | Paul A. Moskowitz, Alejandro G. Schrott, Charles P. Tresser, Robert J. von Gutfeld | 2001-05-01 |
| 6141093 | Method and apparatus for locating power plane shorts using polarized light microscopy | Bernell E. Argyle, Michael E. Scaman, Edward J. Yarmchuk | 2000-10-31 |
| 6115616 | Hand held telephone set with separable keyboard | Joseph D. Rutledge, Alejandro G. Schrott, Charles P. Tresser, Robert J. von Gutfeld, Chai Wah Wu | 2000-09-05 |
| 6072313 | In-situ monitoring and control of conductive films by detecting changes in induced eddy currents | Leping Li, Steven G. Barbee, Tony F. Heinz | 2000-06-06 |
| 5770948 | Rotary signal coupling for chemical mechanical polishing endpoint detection with a strasbaugh tool | Leping Li, Steven G. Barbee, Richard Ruggiero, William Joseph Surovie | 1998-06-23 |
| 5731697 | In-situ monitoring of the change in thickness of films | Leping Li, Steven G. Barbee, Tony F. Heinz | 1998-03-24 |
| 5663637 | Rotary signal coupling for chemical mechanical polishing endpoint detection with a westech tool | Leping Li, Steven G. Barbee, Gary R. Doyle, Kevin L. Holland, Francis Walter Kazak +4 more | 1997-09-02 |
| 5660672 | In-situ monitoring of conductive films on semiconductor wafers | Leping Li, Steven G. Barbee, Tony F. Heinz | 1997-08-26 |
| 5659492 | Chemical mechanical polishing endpoint process control | Leping Li, Steven G. Barbee | 1997-08-19 |
| 5644221 | Endpoint detection for chemical mechanical polishing using frequency or amplitude mode | Leping Li, Steven G. Barbee | 1997-07-01 |
| 5621327 | System and method for testing and fault isolation of high density passive boards and substrates | Shinwu Chiang, Huntington W. Curtis, Arthur E. Falls, John P. Karidis, John D. Mackay +3 more | 1997-04-15 |
| 5559428 | In-situ monitoring of the change in thickness of films | Leping Li, Steven G. Barbee, Tony F. Heinz | 1996-09-24 |
| 5402072 | System and method for testing and fault isolation of high density passive boards and substrates | Shinwu Chiang, Huntington W. Curtis, Arthur E. Falls, John P. Karidis, John D. Mackay +3 more | 1995-03-28 |
| 4868506 | Defect detection using intermodulation signals | Thomas H. DiStefano, Arthur E. Falls, John D. Mackay | 1989-09-19 |
| 4496900 | Nonlinearity detection using fault-generated second harmonic | Thomas H. Di Stefano | 1985-01-29 |