AH

Arnold Halperin

IBM: 20 patents #5,451 of 70,183Top 8%
Overall (All Time): #225,370 of 4,157,543Top 6%
20
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7808257 Ionization test for electrical verification Christopher Cline, Edward J. Yarmchuk, Vincent A. Arena, Donald A. Merte, Thomas Picunko +4 more 2010-10-05
6400128 Thermal modulation system and method for locating a circuit defect Daniel Guidotti, Michael E. Scaman, Arthur R. Zingher 2002-06-04
6337218 Method to test devices on high performance ULSI wafers Cyprian Emeka Uzoh, Stephen A. Cohen 2002-01-08
6242923 Method for detecting power plane-to-power plane shorts and I/O net-to power plane shorts in modules and printed circuit boards Michael E. Scaman, Edward J. Yarmchuk 2001-06-05
6236196 Thermal modulation system and method for locating a circuit defect such as a short or incipient open independent of a circuit geometry Daniel Guidotti, Michael E. Scaman, Arthur R. Zingher 2001-05-22
6226619 Method and system for preventing counterfeiting of high price wholesale and retail items Paul A. Moskowitz, Alejandro G. Schrott, Charles P. Tresser, Robert J. von Gutfeld 2001-05-01
6141093 Method and apparatus for locating power plane shorts using polarized light microscopy Bernell E. Argyle, Michael E. Scaman, Edward J. Yarmchuk 2000-10-31
6115616 Hand held telephone set with separable keyboard Joseph D. Rutledge, Alejandro G. Schrott, Charles P. Tresser, Robert J. von Gutfeld, Chai Wah Wu 2000-09-05
6072313 In-situ monitoring and control of conductive films by detecting changes in induced eddy currents Leping Li, Steven G. Barbee, Tony F. Heinz 2000-06-06
5770948 Rotary signal coupling for chemical mechanical polishing endpoint detection with a strasbaugh tool Leping Li, Steven G. Barbee, Richard Ruggiero, William Joseph Surovie 1998-06-23
5731697 In-situ monitoring of the change in thickness of films Leping Li, Steven G. Barbee, Tony F. Heinz 1998-03-24
5663637 Rotary signal coupling for chemical mechanical polishing endpoint detection with a westech tool Leping Li, Steven G. Barbee, Gary R. Doyle, Kevin L. Holland, Francis Walter Kazak +4 more 1997-09-02
5660672 In-situ monitoring of conductive films on semiconductor wafers Leping Li, Steven G. Barbee, Tony F. Heinz 1997-08-26
5659492 Chemical mechanical polishing endpoint process control Leping Li, Steven G. Barbee 1997-08-19
5644221 Endpoint detection for chemical mechanical polishing using frequency or amplitude mode Leping Li, Steven G. Barbee 1997-07-01
5621327 System and method for testing and fault isolation of high density passive boards and substrates Shinwu Chiang, Huntington W. Curtis, Arthur E. Falls, John P. Karidis, John D. Mackay +3 more 1997-04-15
5559428 In-situ monitoring of the change in thickness of films Leping Li, Steven G. Barbee, Tony F. Heinz 1996-09-24
5402072 System and method for testing and fault isolation of high density passive boards and substrates Shinwu Chiang, Huntington W. Curtis, Arthur E. Falls, John P. Karidis, John D. Mackay +3 more 1995-03-28
4868506 Defect detection using intermodulation signals Thomas H. DiStefano, Arthur E. Falls, John D. Mackay 1989-09-19
4496900 Nonlinearity detection using fault-generated second harmonic Thomas H. Di Stefano 1985-01-29