SC

Stephen A. Cohen

IBM: 9 patents #11,918 of 70,183Top 20%
AD Analog Devices: 4 patents #435 of 1,943Top 25%
TE Teradyne: 2 patents #137 of 581Top 25%
Overall (All Time): #298,781 of 4,157,543Top 8%
16
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
9018089 Multiple step anneal method and semiconductor formed by multiple step anneal Eric G. Liniger, Griselda Bonilla, Pak Leung, Stephen M. Gates, Thomas M. Shaw 2015-04-28
8642460 Semiconductor switching device and method of making the same Chih-Chao Yang, Baozhen Li 2014-02-04
8078244 Interferometric method and instrument for measurement and monitoring blood glucose through measurement of tissue refractive index Paul Melman 2011-12-13
7755159 DUV laser annealing and stabilization of SiCOH films Alessandro C. Callegari, Fuad E. Doany 2010-07-13
7560794 DUV laser annealing and stabilization of SiCOH films Alessandro C. Callegari, Fuad E. Doany 2009-07-14
7489123 Calibration control for pin electronics of automatic testing equipment Thomas G. O'Dwyer 2009-02-10
7106041 Current mirror apparatus and method for reduced early effect 2006-09-12
6759321 Stabilization of fluorine-containing low-k dielectrics in a metal/insulator wiring structure by ultraviolet irradiation Katherina Babich, Alessandro C. Callegari, Alfred Grill, Christopher V. Jahnes, Vishnubhai V. Patel +2 more 2004-07-06
6714078 Sensor structures and methods for reduction of differential-heating signal errors in integrated circuits 2004-03-30
6657305 Semiconductor recessed mask interconnect technology Timothy J. Dalton, John A. Fitzsimmons, Stephen M. Gates, Brian Herbst, Sampath Purushothaman +1 more 2003-12-02
6448655 Stabilization of fluorine-containing low-k dielectrics in a metal/insulator wiring structure by ultraviolet irradiation Katherina Babich, Alessandro C. Callegari, Alfred Grill, Christopher V. Jahnes, Vishnubhai V. Patel +2 more 2002-09-10
6337218 Method to test devices on high performance ULSI wafers Cyprian Emeka Uzoh, Arnold Halperin 2002-01-08
6313682 Pulse generation circuit and method with transmission pre-emphasis Richard R. Muller, Jr. 2001-11-06
5631572 Printed circuit board tester using magnetic induction Timothy Sheen, Jiann-Neng Chen, Michael A. Baglino, Joseph F. Wrinn 1997-05-20
5559367 Diamond-like carbon for use in VLSI and ULSI interconnect systems Daniel C. Edelstein, Alfred Grill, Jurij R. Paraszczak, Vishnubhai V. Patel 1996-09-24
4734637 Apparatus for measuring the length of an electrical line Jiann-Neng Chen 1988-03-29