Issued Patents All Time
Showing 25 most recent of 47 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12093838 | Efficient execution of a decision tree | Jing Xu, Si Er Han, Xue Ying Zhang, Ji Hui Yang | 2024-09-17 |
| 11562400 | Uplift modeling | Jing Xu, Si Er Han, Xue Ying Zhang, Ji Hui Yang | 2023-01-24 |
| 11443235 | Identifying optimal weights to improve prediction accuracy in machine learning techniques | Jing Xu, Si Er Han, Xue Ying Zhang, Ji Hui Yang | 2022-09-13 |
| 9189543 | Predicting service request breaches | Yogesh P. Badhe, George E. Stark | 2015-11-17 |
| 7953689 | Combined feature creation to increase data mining signal in hybrid datasets | — | 2011-05-31 |
| 7895168 | Data mining using variable rankings and enhanced visualization methods | Benjamin Chu, John W. Hopkins | 2011-02-22 |
| 7502658 | Methods of fabricating optimization involving process sequence analysis | Jeong Woo Nam, Viorel Ontalus, Yuusheng Song | 2009-03-10 |
| 6989683 | Enhanced endpoint detection for wet etch process control | Leping Li | 2006-01-24 |
| 6899784 | Apparatus for detecting CMP endpoint in acidic slurries | Leping Li, Scott R. Cline, James Albert Gilhooly, Walter Imfeld, Werner Moser +4 more | 2005-05-31 |
| 6878629 | Method for detecting CMP endpoint in acidic slurries | Leping Li, Scott R. Cline, James Albert Gilhooly, Xinhui Wang, Cong Wei | 2005-04-12 |
| 6858532 | Low defect pre-emitter and pre-base oxide etch for bipolar transistors and related tooling | Wesley C. Natzle, David C. Ahlgren, Marc W. Cantell, Basanth Jagannathan, Louis D. Lanzerotti +2 more | 2005-02-22 |
| 6843880 | Enhanced endpoint detection for wet etch process control | Leping Li | 2005-01-18 |
| 6291351 | Endpoint detection in chemical-mechanical polishing of cloisonne structures | Leping Li, Eric James Lee, Francisco Martin, Cong Wei | 2001-09-18 |
| 6072313 | In-situ monitoring and control of conductive films by detecting changes in induced eddy currents | Leping Li, Arnold Halperin, Tony F. Heinz | 2000-06-06 |
| 5788801 | Real time measurement of etch rate during a chemical etching process | Tony F. Heinz, Yiping Hsiao, Leping Li, Eugene H. Ratzlaff, Justin W. Wong | 1998-08-04 |
| 5770948 | Rotary signal coupling for chemical mechanical polishing endpoint detection with a strasbaugh tool | Leping Li, Arnold Halperin, Richard Ruggiero, William Joseph Surovie | 1998-06-23 |
| 5731697 | In-situ monitoring of the change in thickness of films | Leping Li, Arnold Halperin, Tony F. Heinz | 1998-03-24 |
| 5728222 | Apparatus for chemical vapor deposition of aluminum oxide | Richard A. Conti, Alexander Kostenko, Narayana V. Sarma, Donald L. Wilson, Justin W. Wong +1 more | 1998-03-17 |
| 5663637 | Rotary signal coupling for chemical mechanical polishing endpoint detection with a westech tool | Leping Li, Gary R. Doyle, Arnold Halperin, Kevin L. Holland, Francis Walter Kazak +4 more | 1997-09-02 |
| 5660672 | In-situ monitoring of conductive films on semiconductor wafers | Leping Li, Arnold Halperin, Tony F. Heinz | 1997-08-26 |
| 5659492 | Chemical mechanical polishing endpoint process control | Leping Li, Arnold Halperin | 1997-08-19 |
| 5648113 | Aluminum oxide LPCVD system | Jonathan D. Chapple-Sokol, Richard A. Conti, Richard Hsiao, James A. O'Neill, Narayana V. Sarma +3 more | 1997-07-15 |
| 5644221 | Endpoint detection for chemical mechanical polishing using frequency or amplitude mode | Leping Li, Arnold Halperin | 1997-07-01 |
| 5614247 | Apparatus for chemical vapor deposition of aluminum oxide | Richard A. Conti, Alexander Kostenko, Narayana V. Sarma, Donald L. Wilson, Justin W. Wong +1 more | 1997-03-25 |
| 5582746 | Real time measurement of etch rate during a chemical etching process | Tony F. Heinz, Yiping Hsiao, Leping Li, Eugene H. Ratzlaff, Justin W. Wong | 1996-12-10 |