ER

Eugene H. Ratzlaff

IBM: 24 patents #4,429 of 70,183Top 7%
📍 Hopewell Junction, NY: #76 of 648 inventorsTop 15%
🗺 New York: #5,468 of 115,490 inventorsTop 5%
Overall (All Time): #175,356 of 4,157,543Top 5%
24
Patents All Time

Issued Patents All Time

Showing 1–24 of 24 patents

Patent #TitleCo-InventorsDate
7705754 Method and system for the compression of probability tables Michael P. Perrone, Jianying Hu 2010-04-27
7627596 Retrieving handwritten documents using multiple document recognizers and techniques allowing both typed and handwritten queries Thomas Yu-Kiu Kwok, James R. Moulic, Kenneth Blair Ocheltree, Michael P. Perrone, John F. Pitrelli +2 more 2009-12-01
7502017 Handwriting recognizer user interface methods Yin-Min Chee 2009-03-10
7400277 Method and system for the compression of probability tables Michael P. Perrone, Jianying Hu 2008-07-15
7260779 Methods and apparatus for automatic page break detection Paul T. Keyser, Michael P. Perrone, Jayashree Subrahmonia 2007-08-21
6826306 System and method for automatic quality assurance of user enrollment in a recognition system James R. Lewis, Julia E. Maners, Kerry A. Ortega, Michael P. Perrone, Jayashree Subrahmonia +2 more 2004-11-30
6757647 Method for encoding regular expressions in a lexigon Krishna S. Nathan 2004-06-29
6603881 Spatial sorting and formatting for handwriting recognition Michael P. Perrone 2003-08-05
6401067 System and method for providing user-directed constraints for handwriting recognition James R. Lewis, Michael P. Perrone, John F. Pitrelli, Jayashree Subrahmonia 2002-06-04
6333994 Spatial sorting and formatting for handwriting recognition Michael P. Perrone 2001-12-25
6326957 System and method for displaying page information in a personal digital notepad Krishna S. Nathan, Michael P. Perrone, John F. Pitrelli, Jayashree Subrahmonia 2001-12-04
5788801 Real time measurement of etch rate during a chemical etching process Steven G. Barbee, Tony F. Heinz, Yiping Hsiao, Leping Li, Justin W. Wong 1998-08-04
5582746 Real time measurement of etch rate during a chemical etching process Steven G. Barbee, Tony F. Heinz, Yiping Hsiao, Leping Li, Justin W. Wong 1996-12-10
5573623 Apparatus for contactless real-time in-situ monitoring of a chemical etching process Steven G. Barbee, Tony F. Heinz, Leping Li 1996-11-12
5573624 Chemical etch monitor for measuring film etching uniformity during a chemical etching process Steven G. Barbee, Tony F. Heinz, Yiping Hsiao, Leping Li, Justin W. Wong 1996-11-12
5516399 Contactless real-time in-situ monitoring of a chemical etching Michael J. Balconi-Lamica, Steven G. Barbee, Tony F. Heinz, Yiping Hsiao, Leping Li +1 more 1996-05-14
5501766 Minimizing overetch during a chemical etching process Steven G. Barbee, Tony F. Heinz, Yiping Hsiao, Leping Li, Justin W. Wong 1996-03-26
5500073 Real time measurement of etch rate during a chemical etching process Steven G. Barbee, Tony F. Heinz, Yiping Hsiao, Leping Li, Justin W. Wong 1996-03-19
5489361 Measuring film etching uniformity during a chemical etching process Steven G. Barbee, Tony F. Heinz, Yiping Hsiao, Leping Li, Justin W. Wong 1996-02-06
5480511 Method for contactless real-time in-situ monitoring of a chemical etching process Steven G. Barbee, Tony F. Heinz, Leping Li 1996-01-02
5456788 Method and apparatus for contactless real-time in-situ monitoring of a chemical etching process Steven G. Barbee, Madhav Datta, Tony F. Heinz, Leping Li, Ravindra V. Shenoy 1995-10-10
5451289 Fixture for in-situ noncontact monitoring of wet chemical etching with passive wafer restraint Steven G. Barbee, Tony F. Heinz, Leping Li 1995-09-19
5445705 Method and apparatus for contactless real-time in-situ monitoring of a chemical etching process Steven G. Barbee, Madhav Datta, Tony F. Heinz, Leping Li, Ravindra V. Shenoy 1995-08-29
5338390 Contactless real-time in-situ monitoring of a chemical etching process Steven G. Barbee, Tony F. Heinz, Leping Li 1994-08-16