Issued Patents All Time
Showing 1–21 of 21 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10580096 | Method for determining integrated network loss rate in UHV AC cross-regional electricity trading | Ting Hu, Yinya Zhang, Dongjun Yang, Shunming Bai, Jingyou Xu +1 more | 2020-03-03 |
| 10379234 | Portable real time in-situ gamma-ray analysis system | Kelly M. Garnick, Thomas A. Scott, Elon M. Malkin, Jennifer T. Szymanski, Steve Laskos +7 more | 2019-08-13 |
| 7779310 | System and method for detecting a work status of a computer system | Po-Chang Wang, Fu-Chuan Chen, Wei Chen | 2010-08-17 |
| 6899784 | Apparatus for detecting CMP endpoint in acidic slurries | Leping Li, Steven G. Barbee, Scott R. Cline, James Albert Gilhooly, Walter Imfeld +4 more | 2005-05-31 |
| 6878629 | Method for detecting CMP endpoint in acidic slurries | Leping Li, Steven G. Barbee, Scott R. Cline, James Albert Gilhooly, Xinhui Wang | 2005-04-12 |
| 6506341 | Chemiluminescence detection apparatus | Leping Li, James Albert Gilhooly, Clifford Owen Morgan, III, Werner Moser, Matthias Kutter +4 more | 2003-01-14 |
| 6440263 | Indirect endpoint detection by chemical reaction and chemiluminescence | Leping Li, James Albert Gilhooly, Clifford Owen Morgan, III, William Joseph Surovic | 2002-08-27 |
| 6419785 | Endpoint detection by chemical reaction | Leping Li, James Albert Gilhooly, Clifford Owen Morgan, III, Chienfan Yu | 2002-07-16 |
| 6291351 | Endpoint detection in chemical-mechanical polishing of cloisonne structures | Leping Li, Steven G. Barbee, Eric James Lee, Francisco Martin | 2001-09-18 |
| 6276987 | Chemical mechanical polishing endpoint process control | Leping Li, James Albert Gilhooly, Clifford Owen Morgan, III | 2001-08-21 |
| 6261851 | Optimization of CMP process by detecting of oxide/nitride interface using IR system | Leping Li, James Albert Gilhooly, Clifford Owen Morgan, III | 2001-07-17 |
| 6254453 | Optimization of chemical mechanical process by detection of oxide/nitride interface using CLD system | Leping Li, James Albert Gilhooly, Clifford Owen Morgan, III | 2001-07-03 |
| 6251784 | Real-time control of chemical-mechanical polishing processing by monitoring ionization current | Leping Li, James Albert Gilhooly, Clifford Owen Morgan, III | 2001-06-26 |
| 6228769 | Endpoint detection by chemical reaction and photoionization | Leping Li, James Albert Gilhooly, Clifford Owen Morgan, III, Chienfan Yu | 2001-05-08 |
| 6228280 | Endpoint detection by chemical reaction and reagent | Leping Li, James Albert Gilhooly, Clifford Owen Morgan, III | 2001-05-08 |
| 6194230 | Endpoint detection by chemical reaction and light scattering | Leping Li, James Albert Gilhooly, Clifford Owen Morgan, III | 2001-02-27 |
| 6180422 | Endpoint detection by chemical reaction | Leping Li, James Albert Gilhooly, Clifford Owen Morgan, III, Chienfan Yu | 2001-01-30 |
| 6176765 | Accumulator for slurry sampling | Leping Li, James Albert Gilhooly, Robert B. Lipori, Clifford Owen Morgan, III, William Joseph Surovic | 2001-01-23 |
| 6126848 | Indirect endpoint detection by chemical reaction and chemiluminescence | Leping Li, James Albert Gilhooly, Clifford Owen Morgan, III, William Joseph Surovic | 2000-10-03 |
| 6066564 | Indirect endpoint detection by chemical reaction | Leping Li, James Albert Gilhooly, Clifford Owen Morgan, III, Chienfan Yu | 2000-05-23 |
| 6021679 | Probe for slurry gas sampling | Leping Li, James Albert Gilhooly, Clifford Owen Morgan, III, Werner Moser, Matthias Kutter +4 more | 2000-02-08 |