CW

Cong Wei

IBM: 18 patents #6,125 of 70,183Top 9%
Foxconn: 1 patents #3,106 of 5,504Top 60%
MT Mirion Technologies: 1 patents #3 of 15Top 20%
Overall (All Time): #207,795 of 4,157,543Top 5%
21
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10580096 Method for determining integrated network loss rate in UHV AC cross-regional electricity trading Ting Hu, Yinya Zhang, Dongjun Yang, Shunming Bai, Jingyou Xu +1 more 2020-03-03
10379234 Portable real time in-situ gamma-ray analysis system Kelly M. Garnick, Thomas A. Scott, Elon M. Malkin, Jennifer T. Szymanski, Steve Laskos +7 more 2019-08-13
7779310 System and method for detecting a work status of a computer system Po-Chang Wang, Fu-Chuan Chen, Wei Chen 2010-08-17
6899784 Apparatus for detecting CMP endpoint in acidic slurries Leping Li, Steven G. Barbee, Scott R. Cline, James Albert Gilhooly, Walter Imfeld +4 more 2005-05-31
6878629 Method for detecting CMP endpoint in acidic slurries Leping Li, Steven G. Barbee, Scott R. Cline, James Albert Gilhooly, Xinhui Wang 2005-04-12
6506341 Chemiluminescence detection apparatus Leping Li, James Albert Gilhooly, Clifford Owen Morgan, III, Werner Moser, Matthias Kutter +4 more 2003-01-14
6440263 Indirect endpoint detection by chemical reaction and chemiluminescence Leping Li, James Albert Gilhooly, Clifford Owen Morgan, III, William Joseph Surovic 2002-08-27
6419785 Endpoint detection by chemical reaction Leping Li, James Albert Gilhooly, Clifford Owen Morgan, III, Chienfan Yu 2002-07-16
6291351 Endpoint detection in chemical-mechanical polishing of cloisonne structures Leping Li, Steven G. Barbee, Eric James Lee, Francisco Martin 2001-09-18
6276987 Chemical mechanical polishing endpoint process control Leping Li, James Albert Gilhooly, Clifford Owen Morgan, III 2001-08-21
6261851 Optimization of CMP process by detecting of oxide/nitride interface using IR system Leping Li, James Albert Gilhooly, Clifford Owen Morgan, III 2001-07-17
6254453 Optimization of chemical mechanical process by detection of oxide/nitride interface using CLD system Leping Li, James Albert Gilhooly, Clifford Owen Morgan, III 2001-07-03
6251784 Real-time control of chemical-mechanical polishing processing by monitoring ionization current Leping Li, James Albert Gilhooly, Clifford Owen Morgan, III 2001-06-26
6228769 Endpoint detection by chemical reaction and photoionization Leping Li, James Albert Gilhooly, Clifford Owen Morgan, III, Chienfan Yu 2001-05-08
6228280 Endpoint detection by chemical reaction and reagent Leping Li, James Albert Gilhooly, Clifford Owen Morgan, III 2001-05-08
6194230 Endpoint detection by chemical reaction and light scattering Leping Li, James Albert Gilhooly, Clifford Owen Morgan, III 2001-02-27
6180422 Endpoint detection by chemical reaction Leping Li, James Albert Gilhooly, Clifford Owen Morgan, III, Chienfan Yu 2001-01-30
6176765 Accumulator for slurry sampling Leping Li, James Albert Gilhooly, Robert B. Lipori, Clifford Owen Morgan, III, William Joseph Surovic 2001-01-23
6126848 Indirect endpoint detection by chemical reaction and chemiluminescence Leping Li, James Albert Gilhooly, Clifford Owen Morgan, III, William Joseph Surovic 2000-10-03
6066564 Indirect endpoint detection by chemical reaction Leping Li, James Albert Gilhooly, Clifford Owen Morgan, III, Chienfan Yu 2000-05-23
6021679 Probe for slurry gas sampling Leping Li, James Albert Gilhooly, Clifford Owen Morgan, III, Werner Moser, Matthias Kutter +4 more 2000-02-08