NL

Nicolas Loubet

IBM: 177 patents #208 of 70,183Top 1%
SS Stmicroelectronics Sa: 131 patents #793 of 4,662Top 20%
CEA: 24 patents #77 of 7,956Top 1%
Globalfoundries: 15 patents #235 of 4,424Top 6%
BS Bell Semiconductor: 7 patents #1 of 5Top 20%
SS Stmicroelectronics (Crolles 2) Sas: 6 patents #72 of 529Top 15%
NB Nxp B.V.: 2 patents #1,098 of 3,591Top 35%
TE Tessera: 2 patents #162 of 271Top 60%
RA Renesas Electronics America: 1 patents #121 of 293Top 45%
ET Elpis Technologies: 1 patents #31 of 121Top 30%
AS Adeia Semiconductor Solutions: 1 patents #22 of 57Top 40%
VG Vitesco Technologies Gmbh: 1 patents #268 of 668Top 45%
Overall (All Time): #1,505 of 4,157,543Top 1%
283
Patents All Time

Issued Patents All Time

Showing 25 most recent of 283 patents

Patent #TitleCo-InventorsDate
12426228 SRAM with staggered stacked FET Kirsten Emilie Moselund, Bogdan Cezar Zota 2025-09-23
12414328 Co-integrating gate-all-around nanosheet transistors and comb-nanosheet transistors Huimei Zhou, Julien Frougier, Ruilong Xie, Miaomiao Wang, Veeraraghavan S. Basker 2025-09-09
12408368 Method of making a semiconductor device using a dummy gate Prasanna Khare 2025-09-02
12402408 Stacked FETS including devices with thick gate oxide Ruilong Xie, Julien Frougier, Junli Wang, Ruqiang Bao, Min Gyu Sung +2 more 2025-08-26
12336294 Gate-cut and separation techniques for enabling independent gate control of stacked transistors Ruilong Xie, Julien Frougier, Lawrence A. Clevenger, Prasad Bhosale, Junli Wang +2 more 2025-06-17
12317555 Gate-all-around nanosheet field effect transistor integrated with fin field effect transistor Julien Frougier, Sagarika Mukesh, Ruqiang Bao, Andrew M. Greene, Jingyun Zhang +1 more 2025-05-27
12310100 Dielectric reflow for boundary control Jing Guo, Ekmini Anuja De Silva, Indira Seshadri, Ruqiang Bao, Nelson Felix 2025-05-20
12278234 Multi-fin FINFET device including epitaxial growth barrier on outside surfaces of outermost fins and related methods Qing Liu, Prasanna Khare 2025-04-15
12268020 Source or drain template for reducing strain loss in spaced-apart nanosheet channels Shogo Mochizuki 2025-04-01
12261173 Semiconductor device with strained channel Shogo Mochizuki 2025-03-25
12237325 Three-dimensional field effect device Huimei Zhou, Su Chen Fan, Shogo Mochizuki, Peng Xu 2025-02-25
12211936 Strained-channel fin FETs Pierre Morin 2025-01-28
12191309 Method to induce strain in finFET channels from an adjacent region Pierre Morin 2025-01-07
12166042 Stacked nanosheet gate-all-around device structures Huiming Bu, Balasubramanian Pranatharthiharan 2024-12-10
12154971 Forming nanosheet transistor using sacrificial spacer and inner spacers Kangguo Cheng, Julien Frougier 2024-11-26
12154945 Backside CMOS trench epi with close N2P space Tao Li, Ruilong Xie, Julien Frougier 2024-11-26
12100746 Gate-all-around field effect transistor with bottom dielectric isolation Julien Frougier, Andrew M. Greene, Ruilong Xie, Maruf Amin Bhuiyan, Veeraraghavan S. Basker 2024-09-24
12087691 Semiconductor structures with backside gate contacts Ruilong Xie, Julien Frougier, Veeraraghavan S. Basker, Lawrence A. Clevenger, Dechao Guo +3 more 2024-09-10
12080709 Dual inner spacer epitaxy in monolithic stacked FETs Sagarika Mukesh, Julien Frougier, Ruilong Xie 2024-09-03
12040373 Liner-free resistance contacts and silicide with silicide stop layer Christian Lavoie, Adra Carr, Nicholas Anthony Lanzillo 2024-07-16
11984493 Formation of nanosheet transistor channels using epitaxial growth Shogo Mochizuki, Kirsten Emilie Moselund, Cezar Bogdan Zota 2024-05-14
11948943 Method to induce strain in FINFET channels from an adjacent region Pierre Morin 2024-04-02
11935929 High aspect ratio shared contacts Ruilong Xie, Julien Frougier, Su Chen Fan, Ravikumar Ramachandran 2024-03-19
11894361 Co-integrated logic, electrostatic discharge, and well contact devices on a substrate Julien Frougier, Sagarika Mukesh, Anthony I. Chou, Andrew M. Greene, Ruilong Xie +4 more 2024-02-06
11894436 Gate-all-around monolithic stacked field effect transistors having multiple threshold voltages Julien Frougier, Ruilong Xie, Andrew M. Greene, Veeraraghavan S. Basker, Balasubramanian Pranatharthiharan 2024-02-06