AC

Anthony I. Chou

IBM: 65 patents #1,172 of 70,183Top 2%
Globalfoundries: 12 patents #298 of 4,424Top 7%
TE Tessera: 2 patents #162 of 271Top 60%
TL Tokyo Electron Limited: 2 patents #2,602 of 5,567Top 50%
GU Globalfoundries U.S.: 1 patents #22 of 211Top 15%
Overall (All Time): #22,658 of 4,157,543Top 1%
80
Patents All Time

Issued Patents All Time

Showing 25 most recent of 80 patents

Patent #TitleCo-InventorsDate
12040250 Heat pipe for vertically stacked field effect transistors Terence B. Hook, Brent A. Anderson 2024-07-16
11894361 Co-integrated logic, electrostatic discharge, and well contact devices on a substrate Julien Frougier, Sagarika Mukesh, Andrew M. Greene, Ruilong Xie, Veeraraghavan S. Basker +4 more 2024-02-06
11101357 Asymmetric high-k dielectric for reducing gate induced drain leakage Arvind Kumar, Chung-Hsun Lin, Shreesh Narasimha, Claude Ortolland, Jonathan T. Shaw 2021-08-24
10734492 Asymmetric high-k dielectric for reducing gate induced drain leakage Arvind Kumar, Chung-Hsun Lin, Shreesh Narasimha, Claude Ortolland, Jonathan T. Shaw 2020-08-04
10580686 Semiconductor structure with integrated passive structures Arvind Kumar, Renee T. Mo, Shreesh Narasimha 2020-03-03
10381452 Asymmetric high-k dielectric for reducing gate induced drain leakage Arvind Kumar, Chung-Hsun Lin, Shreesh Narasimha, Claude Ortolland, Jonathan T. Shaw 2019-08-13
10374048 Asymmetric high-k dielectric for reducing gate induced drain leakage Arvind Kumar, Chung-Hsun Lin, Shreesh Narasimha, Claude Ortolland, Jonathan T. Shaw 2019-08-06
10367072 Asymmetric high-k dielectric for reducing gate induced drain leakage Arvind Kumar, Chung-Hsun Lin, Shreesh Narasimha, Claude Ortolland, Jonathan T. Shaw 2019-07-30
10256152 Methods of making FinFET device comprising a piezoelectric liner for generating a surface charge Qun Gao, Naved Siddiqui 2019-04-09
10242906 Semiconductor structure with integrated passive structures Arvind Kumar, Renee T. Mo, Shreesh Narasimha 2019-03-26
10049942 Asymmetric semiconductor device and method of forming same Judson R. Holt, Arvind Kumar, Henry K. Utomo 2018-08-14
10032862 Semiconductor structure with integrated passive structures Arvind Kumar, Renee T. Mo, Shreesh Narasimha 2018-07-24
10014364 On-chip resistors with a tunable temperature coefficient of resistance Qun Gao, Stephen Furkay, Naved Siddiqui 2018-07-03
9923082 Junction butting structure using nonuniform trench shape Judson R. Holt, Arvind Kumar, Henry K. Utomo 2018-03-20
9922831 Asymmetric high-k dielectric for reducing gate induced drain leakage Arvind Kumar, Chung-Hsun Lin, Shreesh Narasimha, Claude Ortolland, Jonathan T. Shaw 2018-03-20
9859122 Asymmetric high-k dielectric for reducing gate induced drain leakage Arvind Kumar, Chung-Hsun Lin, Shreesh Narasimha, Claude Ortolland, Jonathan T. Shaw 2018-01-02
9837319 Asymmetric high-K dielectric for reducing gate induced drain leakage Arvind Kumar, Chung-Hsun Lin, Shreesh Narasimha, Claude Ortolland, Jonathan T. Shaw 2017-12-05
9768071 Asymmetric high-K dielectric for reducing gate induced drain leakage Arvind Kumar, Chung-Hsun Lin, Shreesh Narasimha, Claude Ortolland, Jonathan T. Shaw 2017-09-19
9768195 Semiconductor structure with integrated passive structures Arvind Kumar, Renee T. Mo, Shreesh Narasimha 2017-09-19
9721843 Asymmetric high-k dielectric for reducing gate induced drain leakage Arvind Kumar, Chung-Hsun Lin, Shreesh Narasimha, Claude Ortolland, Jonathan T. Shaw 2017-08-01
9703301 Methods and control systems of resistance adjustment of resistors Arvind Kumar, Sungjae Lee 2017-07-11
9698159 Semiconductor structure with integrated passive structures Arvind Kumar, Renee T. Mo, Shreesh Narasimha 2017-07-04
9685379 Asymmetric high-k dielectric for reducing gate induced drain leakage Arvind Kumar, Chung-Hsun Lin, Shreesh Narasimha, Claude Ortolland, Jonathan T. Shaw 2017-06-20
9659961 Semiconductor structure with integrated passive structures Arvind Kumar, Renee T. Mo, Shreesh Narasimha 2017-05-23
9627480 Junction butting structure using nonuniform trench shape Judson R. Holt, Arvind Kumar, Henry K. Utomo 2017-04-18