CO

Claude Ortolland

IBM: 17 patents #6,502 of 70,183Top 10%
Globalfoundries: 6 patents #578 of 4,424Top 15%
GU Globalfoundries U.S.: 3 patents #166 of 665Top 25%
TE Tessera: 2 patents #162 of 271Top 60%
Overall (All Time): #130,406 of 4,157,543Top 4%
29
Patents All Time

Issued Patents All Time

Showing 25 most recent of 29 patents

Patent #TitleCo-InventorsDate
11374092 Virtual bulk in semiconductor on insulator technology John J. Pekarik, Vibhor Jain, Herbert L. Ho, Qizhi Liu 2022-06-28
11217685 Heterojunction bipolar transistor with marker layer Herbert L. Ho, Vibhor Jain, John J. Pekarik, Judson R. Holt, Qizhi Liu +1 more 2022-01-04
11145725 Heterojunction bipolar transistor Qizhi Liu, Vibhor Jain, Judson R. Holt, Herbert L. Ho, John J. Pekarik 2021-10-12
11101357 Asymmetric high-k dielectric for reducing gate induced drain leakage Anthony I. Chou, Arvind Kumar, Chung-Hsun Lin, Shreesh Narasimha, Jonathan T. Shaw 2021-08-24
10734492 Asymmetric high-k dielectric for reducing gate induced drain leakage Anthony I. Chou, Arvind Kumar, Chung-Hsun Lin, Shreesh Narasimha, Jonathan T. Shaw 2020-08-04
10381452 Asymmetric high-k dielectric for reducing gate induced drain leakage Anthony I. Chou, Arvind Kumar, Chung-Hsun Lin, Shreesh Narasimha, Jonathan T. Shaw 2019-08-13
10374048 Asymmetric high-k dielectric for reducing gate induced drain leakage Anthony I. Chou, Arvind Kumar, Chung-Hsun Lin, Shreesh Narasimha, Jonathan T. Shaw 2019-08-06
10367072 Asymmetric high-k dielectric for reducing gate induced drain leakage Anthony I. Chou, Arvind Kumar, Chung-Hsun Lin, Shreesh Narasimha, Jonathan T. Shaw 2019-07-30
10170304 Self-aligned nanotube structures Oh-Jung Kwon, Dominic J. Schepis, Christopher N. Collins 2019-01-01
9953873 Methods of modulating the morphology of epitaxial semiconductor material Bhupesh Chandra, Gregory G. Freeman, Viorel Ontalus, Christopher D. Sheraw, Timothy J. McArdle +1 more 2018-04-24
9922831 Asymmetric high-k dielectric for reducing gate induced drain leakage Anthony I. Chou, Arvind Kumar, Chung-Hsun Lin, Shreesh Narasimha, Jonathan T. Shaw 2018-03-20
9871057 Field-effect transistors with a non-relaxed strained channel Karen A. Nummy 2018-01-16
9859122 Asymmetric high-k dielectric for reducing gate induced drain leakage Anthony I. Chou, Arvind Kumar, Chung-Hsun Lin, Shreesh Narasimha, Jonathan T. Shaw 2018-01-02
9837319 Asymmetric high-K dielectric for reducing gate induced drain leakage Anthony I. Chou, Arvind Kumar, Chung-Hsun Lin, Shreesh Narasimha, Jonathan T. Shaw 2017-12-05
9831084 Hydroxyl group termination for nucleation of a dielectric metallic oxide Takashi Ando, Michael P. Chudzik, Min Dai, Martin M. Frank, David F. Hilscher +3 more 2017-11-28
9768071 Asymmetric high-K dielectric for reducing gate induced drain leakage Anthony I. Chou, Arvind Kumar, Chung-Hsun Lin, Shreesh Narasimha, Jonathan T. Shaw 2017-09-19
9722045 Buffer layer for modulating Vt across devices Bhupesh Chandra, Viorel Ontalus, Timothy J. McArdle, Paul Chang, Judson R. Holt 2017-08-01
9721843 Asymmetric high-k dielectric for reducing gate induced drain leakage Anthony I. Chou, Arvind Kumar, Chung-Hsun Lin, Shreesh Narasimha, Jonathan T. Shaw 2017-08-01
9685379 Asymmetric high-k dielectric for reducing gate induced drain leakage Anthony I. Chou, Arvind Kumar, Chung-Hsun Lin, Shreesh Narasimha, Jonathan T. Shaw 2017-06-20
9620384 Control of O-ingress into gate stack dielectric layer using oxygen permeable layer Takashi Ando, Kai Zhao 2017-04-11
9577061 Asymmetric high-K dielectric for reducing gate induced drain leakage Anthony I. Chou, Arvind Kumar, Chung-Hsun Lin, Shreesh Narasimha, Jonathan T. Shaw 2017-02-21
9570354 Asymmetric high-K dielectric for reducing gate induced drain leakage Anthony I. Chou, Arvind Kumar, Chung-Hsun Lin, Shreesh Narasimha, Jonathan T. Shaw 2017-02-14
9559010 Asymmetric high-k dielectric for reducing gate induced drain leakage Anthony I. Chou, Arvind Kumar, Chung-Hsun Lin, Shreesh Narasimha, Jonathan T. Shaw 2017-01-31
9543213 Asymmetric high-k dielectric for reducing gate induced drain leakage Anthony I. Chou, Arvind Kumar, Chung-Hsun Lin, Shreesh Narasimha, Jonathan T. Shaw 2017-01-10
9412667 Asymmetric high-k dielectric for reducing gate induced drain leakage Anthony I. Chou, Arvind Kumar, Chung-Hsun Lin, Shreesh Narasimha, Jonathan T. Shaw 2016-08-09