LC

Lawrence A. Clevenger

IBM: 599 patents #13 of 70,183Top 1%
SS Stmicroelectronics Sa: 29 patents #33 of 1,676Top 2%
TE Tessera: 13 patents #34 of 271Top 15%
Globalfoundries: 13 patents #279 of 4,424Top 7%
Infineon Technologies Ag: 10 patents #1,105 of 7,486Top 15%
AS Adeia Semiconductor Solutions: 4 patents #2 of 57Top 4%
GP Globalfoundries Singapore Pte.: 3 patents #212 of 828Top 30%
ET Elpis Technologies: 3 patents #8 of 121Top 7%
KY Kyndryl: 1 patents #287 of 874Top 35%
FS Freeescale Semiconductor: 1 patents #2,021 of 3,767Top 55%
Samsung: 1 patents #49,284 of 75,807Top 70%
CM Chartered Semiconductor Manufacturing: 1 patents #419 of 840Top 50%
📍 Saratoga Springs, NY: #1 of 363 inventorsTop 1%
🗺 New York: #13 of 115,490 inventorsTop 1%
Overall (All Time): #217 of 4,157,543Top 1%
635
Patents All Time

Issued Patents All Time

Showing 126–150 of 635 patents

Patent #TitleCo-InventorsDate
11101172 Dielectric damage-free dual damascene Cu interconnects without barrier at via bottom Koichi Motoyama, Benjamin D. Briggs, Gangadhara Raja Muthinti, Cornelius Brown Peethala 2021-08-24
11094637 Multi-chip package structures having embedded chip interconnect bridges and fan-out redistribution layers Joshua M. Rubin, Steven L. Wright 2021-08-17
11083837 Secure medication delivery Ira L. Allen, Gregory J. Boss, Andrew R. Jones, Kevin C. McConnell, John E. Moore, Jr. 2021-08-10
11069564 Double metal patterning Hsueh-Chung Chen, Yongan Xu, Yann Mignot, James J. Kelly 2021-07-20
11068896 Granting requests for authorization using data of devices associated with requestors Spyridon Skordas, Richard C. Johnson 2021-07-20
11063089 Resistive memory device with meshed electrodes Takashi Ando, Chih-Chao Yang, Michael Rizzolo 2021-07-13
11062993 Contacts having a geometry to reduce resistance Baozhen Li, Kirk D. Peterson, Terry A. Spooner, Junli Wang 2021-07-13
11062943 Top via interconnects with wrap around liner Koichi Motoyama, Nicholas Anthony Lanzillo, Christopher J. Penny, Somnath Ghosh, Robert R. Robison 2021-07-13
11056429 Semiconductor device including a porous dielectric layer, and method of forming the semiconductor device Benjamin D. Briggs, Bartlet H. DeProspo, Huai Huang, Christopher J. Penny, Michael Rizzolo 2021-07-06
11049744 Optimizing semiconductor binning by feed-forward process adjustment Benjamin D. Briggs, Nicholas Anthony Lanzillo, Michael Rizzolo, Theodorus E. Standaert, James H. Stathis 2021-06-29
11049727 Interleaved structure for molecular manipulation Shawn P. Fetterolf, Donald F. Canaperi, Kangguo Cheng 2021-06-29
11043494 Structure and method for equal substrate to channel height between N and P fin-FETs Leigh Anne H. Clevenger, Mona A. Ebrish, Gauri Karve, Fee Li Lie, Deepika Priyadarshini +2 more 2021-06-22
11024551 Metal replacement vertical interconnections for buried capacitance Hsueh-Chung Chen, Daniel James Dechene, Somnath Ghosh, Carl Radens 2021-06-01
11018090 Selective CVD alignment-mark topography assist for non-volatile memory Michael Rizzolo, Chih-Chao Yang, Benjamin D. Briggs 2021-05-25
11018007 Self aligned pattern formation post spacer etchback in tight pitch configurations Sean D. Burns, Matthew E. Colburn, Nelson Felix, Sivananda K. Kanakasabapathy, Christopher J. Penny +2 more 2021-05-25
11004790 Method of manufacturing an interconnect without dielectric exclusion zones by thermal decomposition of a sacrificial filler material Benjamin D. Briggs, Christopher J. Penny, Michael Rizzolo 2021-05-11
11004736 Integrated circuit having a single damascene wiring network Hsueh-Chung Chen, Junli Wang, Somnath Ghosh, Chih-Chao Yang 2021-05-11
10998193 Spacer-assisted lithographic double patterning Timothy Mathew Philip, Somnath Ghosh, Daniel James Dechene, Robert R. Robison 2021-05-04
10991619 Top via process accounting for misalignment by increasing reliability Chen Zhang, Benjamin D. Briggs, Brent A. Anderson, Chih-Chao Yang 2021-04-27
10985063 Semiconductor device with local connection Kangguo Cheng, Carl Radens, Junli Wang, John H. Zhang 2021-04-20
10978393 Hybrid dielectric scheme for varying liner thickness and manganese concentration Benjamin D. Briggs, Nicholas Anthony Lanzillo, Takeshi Nogami, Christopher J. Penny, Michael Rizzolo 2021-04-13
10978343 Interconnect structure having fully aligned vias Chanro Park, Nicholas Anthony Lanzillo, Christopher J. Penny, Balasubramanian Pranatharthiharan 2021-04-13
10971030 Remote physical training Benjamin D. Briggs, Leigh Anne H. Clevenger, Christopher J. Penny, Michael Rizzolo, Aldis Sipolins 2021-04-06
10964588 Selective ILD deposition for fully aligned via with airgap Christopher J. Penny, Benjamin D. Briggs, Huai Huang, Michael Rizzolo, Hosadurga Shobha 2021-03-30
10957646 Hybrid BEOL metallization utilizing selective reflection mask Benjamin D. Briggs, Cornelius Brown Peethala, Michael Rizzolo, Koichi Motoyama, Gen Tsutsui +2 more 2021-03-23