RR

Robert R. Robison

IBM: 128 patents #372 of 70,183Top 1%
Globalfoundries: 13 patents #279 of 4,424Top 7%
TE Tessera: 3 patents #129 of 271Top 50%
ET Elpis Technologies: 1 patents #31 of 121Top 30%
GU Globalfoundries U.S.: 1 patents #22 of 211Top 15%
Overall (All Time): #6,545 of 4,157,543Top 1%
146
Patents All Time

Issued Patents All Time

Showing 25 most recent of 146 patents

Patent #TitleCo-InventorsDate
12432960 Wraparound contact with reduced distance to channel Ruilong Xie, Reinaldo Vega, Yao Yao, Andrew M. Greene, Veeraraghavan S. Basker +2 more 2025-09-30
12402546 Composite material phase change memory cell Timothy Mathew Philip, Kevin W. Brew, Caitlin Camille Stuckey, Rebecca Martin, Lawrence A. Clevenger 2025-08-26
12402391 Stressed material within gate cut region Huimei Zhou, Andrew M. Greene, Michael P. Belyansky, Oleg Gluschenkov, Juntao Li +2 more 2025-08-26
12356685 Looped long channel field-effect transistor Ruilong Xie, Ardasheir Rahman, Hemanth Jagannathan, Brent A. Anderson, Heng Wu 2025-07-08
12268030 Self-aligned C-shaped vertical field effect transistor Ruilong Xie, Hemanth Jagannathan, Jay William Strane 2025-04-01
12243819 Single-mask alternating line deposition Brent A. Anderson, Lawrence A. Clevenger, Christopher J. Penny, Kisik Choi, Nicholas Anthony Lanzillo 2025-03-04
12062703 Self aligned replacement metal source/drain FINFET Emre Alptekin, Reinaldo Vega 2024-08-13
12015069 Gate-all-around field effect transistor having multiple threshold voltages Ruqiang Bao, Michael A. Guillorn, Terence B. Hook, Reinaldo Vega, Tenko Yamashita 2024-06-18
11990410 Top via interconnect having a line with a reduced bottom dimension Brent A. Anderson, Lawrence A. Clevenger, Nicholas Anthony Lanzillo, Christopher J. Penny, Kisik Choi 2024-05-21
11961759 Interconnects having spacers for improved top via critical dimension and overlay tolerance Brent A. Anderson, Lawrence A. Clevenger, Nicholas Anthony Lanzillo, Christopher J. Penny, Kisik Choi 2024-04-16
11894265 Top via with damascene line and via Lawrence A. Clevenger, Brent A. Anderson, Kisik Choi, Nicholas Anthony Lanzillo, Christopher J. Penny 2024-02-06
11869937 Semiconductor device and method of forming the semiconductor device Marc A. Bergendahl, Gauri Karve, Fee Li Lie, Eric R. Miller, John R. Sporre +1 more 2024-01-09
11869936 Semiconductor device and method of forming the semiconductor device Marc A. Bergendahl, Gauri Karve, Fee Li Lie, Eric R. Miller, John R. Sporre +1 more 2024-01-09
11869808 Top via process with damascene metal Lawrence A. Clevenger, Brent A. Anderson, Nicholas Anthony Lanzillo, Christopher J. Penny, Kisik Choi 2024-01-09
11854884 Fully aligned top vias Nicholas Anthony Lanzillo, Koichi Motoyama, Somnath Ghosh, Christopher J. Penny, Lawrence A. Clevenger 2023-12-26
11823998 Top via with next level line selective growth Brent A. Anderson, Lawrence A. Clevenger, Christopher J. Penny, Nicholas Anthony Lanzillo, Kisik Choi 2023-11-21
11804406 Top via cut fill process for line extension reduction Christopher J. Penny, Brent A. Anderson, Lawrence A. Clevenger, Kisik Choi, Nicholas Anthony Lanzillo 2023-10-31
11791258 Conductive lines with subtractive cuts Brent A. Anderson, Lawrence A. Clevenger, Kisik Choi, Nicholas Anthony Lanzillo, Christopher J. Penny 2023-10-17
11757012 Source and drain contact cut last process to enable wrap-around-contact Andrew M. Greene, Dechao Guo, Tenko Yamashita, Veeraraghavan S. Basker, Ardasheir Rahman 2023-09-12
11682617 High aspect ratio vias for integrated circuits Nicholas Anthony Lanzillo, Somnath Ghosh, Lawrence A. Clevenger 2023-06-20
11670542 Stepped top via for via resistance reduction Brent A. Anderson, Lawrence A. Clevenger, Christopher J. Penny, Kisik Choi, Nicholas Anthony Lanzillo 2023-06-06
11621189 Barrier-less prefilled via formation Nicholas Anthony Lanzillo, Hosadurga Shobha, Junli Wang, Lawrence A. Clevenger, Christopher J. Penny +1 more 2023-04-04
11600565 Top via stack Brent A. Anderson, Lawrence A. Clevenger, Christopher J. Penny, Kisik Choi, Nicholas Anthony Lanzillo 2023-03-07
11527434 Line cut patterning using sacrificial material Timothy Mathew Philip, Daniel James Dechene, Somnath Ghosh 2022-12-13
11437317 Single-mask alternating line deposition Brent A. Anderson, Lawrence A. Clevenger, Christopher J. Penny, Kisik Choi, Nicholas Anthony Lanzillo 2022-09-06