Issued Patents All Time
Showing 1–25 of 145 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11891698 | Turbulence-reducing device for stirring a surface treatment solution | Tomoji Okuda, Daisuke Matsuyama, Masayuki Kiso, Daisuke Hashimoto, Keita Taniguchi | 2024-02-06 |
| 11551768 | Read and verify methodology and structure to counter gate SiO2 dependence of non-volatile memory cells | Rajdeep Gautam | 2023-01-10 |
| 11173513 | Surface treatment device comprising a paddle for stirring a surface treatment solution, paddle for stirring a surface treatment solution and method thereof | Tomoji Okuda, Daisuke Matsuyama, Masayuki Kiso, Daisuke Hashimoto, Keita Taniguchi | 2021-11-16 |
| 10725086 | Evaluation apparatus of semiconductor device and method of evaluating semiconductor device using the same | Takaya Noguchi | 2020-07-28 |
| 10539607 | Evaluation apparatus including a plurality of insulating portions surrounding a probe and semiconductor device evaluation method based thereon | Kinya YAMASHITA, Masaki Ueno | 2020-01-21 |
| 10495668 | Evaluation apparatus for semiconductor device and evaluation method for semiconductor device | Takaya Noguchi | 2019-12-03 |
| 10436833 | Evaluation apparatus and evaluation method | Kinya YAMASHITA, Masaki Ueno, Takaya Noguchi | 2019-10-08 |
| 10359448 | Device and method for inspecting position of probe, and semiconductor evaluation apparatus | Takaya Noguchi, Norihiro Takesako | 2019-07-23 |
| 10228412 | Semiconductor device and method for testing same | Hajime Akiyama, Kinya YAMASHITA | 2019-03-12 |
| 10224388 | Wiring core structure, semiconductor evaluation device and semiconductor device | Masayoshi Hirao, Kazushige Matsuo | 2019-03-05 |
| 10209273 | Probe position inspection apparatus, semiconductor device inspection apparatus and semiconductor device inspection method | Norihiro Takesako, Takaya Noguchi | 2019-02-19 |
| 10192797 | Semiconductor device and electrical contact structure thereof | Hajime Akiyama, Kinya YAMASHITA | 2019-01-29 |
| 10168380 | Semiconductor device evaluation jig, semiconductor device evaluation apparatus, and semiconductor device evaluation method | Takaya Noguchi, Koichi Mochizuki | 2019-01-01 |
| 10068814 | Apparatus and method for evaluating semiconductor device comprising thermal image processing | Norihiro Takesako, Hajime Akiyama | 2018-09-04 |
| 9995786 | Apparatus and method for evaluating semiconductor device | Norihiro Takesako, Hajime Akiyama | 2018-06-12 |
| 9974184 | Printed board, electronic device, and method for manufacturing electronic device | Mitsuaki Hayashi, Osamu Saito, Junichi Hayama | 2018-05-15 |
| 9880196 | Semiconductor device inspection apparatus and semiconductor device inspection method | Hajime Akiyama | 2018-01-30 |
| 9804197 | Evaluation apparatus and probe position inspection method | Norihiro Takesako, Takaya Noguchi | 2017-10-31 |
| 9720014 | Semiconductor evaluation apparatus and semiconductor evaluation method | Kosuke Hatozaki, Kinya YAMASHITA | 2017-08-01 |
| 9722060 | Semiconductor device and semiconductor module | Hiroyuki Nakamura, Eiji Nojiri | 2017-08-01 |
| 9684027 | Measuring apparatus | Takaya Noguchi, Takayuki Shirotori | 2017-06-20 |
| 9684015 | Measuring apparatus and measuring method utilizing insulating liquid | Takaya Noguchi, Kosuke Hatozaki | 2017-06-20 |
| 9678143 | Semiconductor evaluation apparatus | Takaya Noguchi, Norihiro Takesako, Kinya YAMASHITA, Hajime Akiyama | 2017-06-13 |
| 9659795 | Foreign matter removal device and foreign matter removal method | Takaya Noguchi, Hajime Akiyama | 2017-05-23 |
| 9568380 | Torque sensor and manufacturing method therefor | Shuntaro Yoshida, Takao Iwaki, Inao Toyoda, Takuya Ishikawa, Kazumasa Ogino | 2017-02-14 |