Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10359448 | Device and method for inspecting position of probe, and semiconductor evaluation apparatus | Akira Okada, Takaya Noguchi | 2019-07-23 |
| 10209273 | Probe position inspection apparatus, semiconductor device inspection apparatus and semiconductor device inspection method | Takaya Noguchi, Akira Okada | 2019-02-19 |
| 10068814 | Apparatus and method for evaluating semiconductor device comprising thermal image processing | Akira Okada, Hajime Akiyama | 2018-09-04 |
| 9995786 | Apparatus and method for evaluating semiconductor device | Akira Okada, Hajime Akiyama | 2018-06-12 |
| 9804197 | Evaluation apparatus and probe position inspection method | Akira Okada, Takaya Noguchi | 2017-10-31 |
| 9678143 | Semiconductor evaluation apparatus | Akira Okada, Takaya Noguchi, Kinya YAMASHITA, Hajime Akiyama | 2017-06-13 |
| 9562929 | Measurement device | Takaya Noguchi, Akira Okada | 2017-02-07 |
| 9257316 | Semiconductor testing jig and transfer jig for the same | Akira Okada, Takaya Noguchi, Kinya YAMASHITA, Hajime Akiyama | 2016-02-09 |
| 8980655 | Test apparatus and test method | Akira Okada, Takaya Noguchi, Kinya YAMASHITA, Hajime Akiyama | 2015-03-17 |
| 6556880 | Production schedule planning device and a method of producing a semiconductor device using the same | Kazunori Morinaga, Akihisa Chikamura | 2003-04-29 |