Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11624767 | Semiconductor test apparatus and semiconductor test method | Yasushi Takaki, Masaki Ueno | 2023-04-11 |
| 10539607 | Evaluation apparatus including a plurality of insulating portions surrounding a probe and semiconductor device evaluation method based thereon | Akira Okada, Masaki Ueno | 2020-01-21 |
| 10436833 | Evaluation apparatus and evaluation method | Akira Okada, Masaki Ueno, Takaya Noguchi | 2019-10-08 |
| 10228412 | Semiconductor device and method for testing same | Hajime Akiyama, Akira Okada | 2019-03-12 |
| 10192797 | Semiconductor device and electrical contact structure thereof | Hajime Akiyama, Akira Okada | 2019-01-29 |
| 9720014 | Semiconductor evaluation apparatus and semiconductor evaluation method | Akira Okada, Kosuke Hatozaki | 2017-08-01 |
| 9678143 | Semiconductor evaluation apparatus | Akira Okada, Takaya Noguchi, Norihiro Takesako, Hajime Akiyama | 2017-06-13 |
| 9551745 | Semiconductor device assessment apparatus | Hajime Akiyama, Akira Okada | 2017-01-24 |
| 9347988 | Semiconductor testing jig and semiconductor testing method performed by using the same | Hajime Akiyama, Akira Okada | 2016-05-24 |
| 9335371 | Semiconductor evaluating device and semiconductor evaluating method | Hajime Akiyama, Akira Okada | 2016-05-10 |
| 9312160 | Wafer suction method, wafer suction stage, and wafer suction system | Hajime Akiyama, Akira Okada | 2016-04-12 |
| 9257316 | Semiconductor testing jig and transfer jig for the same | Akira Okada, Takaya Noguchi, Norihiro Takesako, Hajime Akiyama | 2016-02-09 |
| 9207257 | Inspection apparatus | Akira Okada, Hajime Akiyama | 2015-12-08 |
| 9188624 | Inspection apparatus | Akira Okada, Hajime Akiyama | 2015-11-17 |
| 9157931 | Probe card | Akira Okada, Hajime Akiyama | 2015-10-13 |
| 9117880 | Method for manufacturing semiconductor device | Hajime Akiyama, Akira Okada | 2015-08-25 |
| 8981805 | Inspection apparatus and inspection method | Akira Okada, Hajime Akiyama | 2015-03-17 |
| 8980655 | Test apparatus and test method | Akira Okada, Takaya Noguchi, Norihiro Takesako, Hajime Akiyama | 2015-03-17 |
| 6675876 | Rotary cooling roller | Tyuichi Itashiki, Tomohiro Motomura, Kunihiko Minami, Iwao Sawada | 2004-01-13 |