Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12345739 | Semiconductor test apparatus and semiconductor test method | Yoshiyuki Ueda | 2025-07-01 |
| 12007414 | Semiconductor test apparatus and semiconductor test method | Yoshiyuki Ueda | 2024-06-11 |
| 11901201 | Semiconductor manufacturing apparatus and method of manufacturing semiconductor device | Shunichi Kawakami | 2024-02-13 |
| 11828786 | Electrical characteristic inspection device for semiconductor device and electrical characteristic inspection method for semiconductor device | Sumito Ogata, Yasushi Hisaoka | 2023-11-28 |
| 11380596 | Semiconductor test apparatus, semiconductor device test method, and semiconductor device manufacturing method | Yuji Ebiike, Yoshinori Ito, Yoshikazu Ikuta, Koichi Takayama | 2022-07-05 |
| 10725086 | Evaluation apparatus of semiconductor device and method of evaluating semiconductor device using the same | Akira Okada | 2020-07-28 |
| 10495668 | Evaluation apparatus for semiconductor device and evaluation method for semiconductor device | Akira Okada | 2019-12-03 |
| 10436833 | Evaluation apparatus and evaluation method | Akira Okada, Kinya YAMASHITA, Masaki Ueno | 2019-10-08 |
| 10359448 | Device and method for inspecting position of probe, and semiconductor evaluation apparatus | Akira Okada, Norihiro Takesako | 2019-07-23 |
| 10209273 | Probe position inspection apparatus, semiconductor device inspection apparatus and semiconductor device inspection method | Norihiro Takesako, Akira Okada | 2019-02-19 |
| 10168380 | Semiconductor device evaluation jig, semiconductor device evaluation apparatus, and semiconductor device evaluation method | Akira Okada, Koichi Mochizuki | 2019-01-01 |
| 9804197 | Evaluation apparatus and probe position inspection method | Norihiro Takesako, Akira Okada | 2017-10-31 |
| 9684027 | Measuring apparatus | Akira Okada, Takayuki Shirotori | 2017-06-20 |
| 9684015 | Measuring apparatus and measuring method utilizing insulating liquid | Akira Okada, Kosuke Hatozaki | 2017-06-20 |
| 9678143 | Semiconductor evaluation apparatus | Akira Okada, Norihiro Takesako, Kinya YAMASHITA, Hajime Akiyama | 2017-06-13 |
| 9659795 | Foreign matter removal device and foreign matter removal method | Akira Okada, Hajime Akiyama | 2017-05-23 |
| 9562929 | Measurement device | Akira Okada, Norihiro Takesako | 2017-02-07 |
| 9257316 | Semiconductor testing jig and transfer jig for the same | Akira Okada, Norihiro Takesako, Kinya YAMASHITA, Hajime Akiyama | 2016-02-09 |
| 9117656 | Semiconductor cleaning device and semiconductor cleaning method | Akira Okada, Hajime Akiyama | 2015-08-25 |
| 8980655 | Test apparatus and test method | Akira Okada, Norihiro Takesako, Kinya YAMASHITA, Hajime Akiyama | 2015-03-17 |