Issued Patents All Time
Showing 1–25 of 52 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10868123 | SiC-SOI device and manufacturing method thereof | Manabu YOSHINO | 2020-12-15 |
| 10228129 | Waste gasification melting apparatus and waste gasification melting method using the same | Satoshi Horiuchi, Keiichi Okuyama, Takeshi Uchiyama, Junya Watanabe, Takashi Nakayama +2 more | 2019-03-12 |
| 10228412 | Semiconductor device and method for testing same | Akira Okada, Kinya YAMASHITA | 2019-03-12 |
| 10192797 | Semiconductor device and electrical contact structure thereof | Akira Okada, Kinya YAMASHITA | 2019-01-29 |
| 10068814 | Apparatus and method for evaluating semiconductor device comprising thermal image processing | Akira Okada, Norihiro Takesako | 2018-09-04 |
| 9995786 | Apparatus and method for evaluating semiconductor device | Akira Okada, Norihiro Takesako | 2018-06-12 |
| 9880196 | Semiconductor device inspection apparatus and semiconductor device inspection method | Akira Okada | 2018-01-30 |
| 9678143 | Semiconductor evaluation apparatus | Akira Okada, Takaya Noguchi, Norihiro Takesako, Kinya YAMASHITA | 2017-06-13 |
| 9659795 | Foreign matter removal device and foreign matter removal method | Akira Okada, Takaya Noguchi | 2017-05-23 |
| 9551745 | Semiconductor device assessment apparatus | Akira Okada, Kinya YAMASHITA | 2017-01-24 |
| 9347988 | Semiconductor testing jig and semiconductor testing method performed by using the same | Akira Okada, Kinya YAMASHITA | 2016-05-24 |
| 9335371 | Semiconductor evaluating device and semiconductor evaluating method | Akira Okada, Kinya YAMASHITA | 2016-05-10 |
| 9312160 | Wafer suction method, wafer suction stage, and wafer suction system | Akira Okada, Kinya YAMASHITA | 2016-04-12 |
| 9257316 | Semiconductor testing jig and transfer jig for the same | Akira Okada, Takaya Noguchi, Norihiro Takesako, Kinya YAMASHITA | 2016-02-09 |
| 9207257 | Inspection apparatus | Akira Okada, Kinya YAMASHITA | 2015-12-08 |
| 9188624 | Inspection apparatus | Akira Okada, Kinya YAMASHITA | 2015-11-17 |
| 9157931 | Probe card | Akira Okada, Kinya YAMASHITA | 2015-10-13 |
| 9121899 | Semiconductor device | Akira Okada | 2015-09-01 |
| 9117880 | Method for manufacturing semiconductor device | Akira Okada, Kinya YAMASHITA | 2015-08-25 |
| 9117656 | Semiconductor cleaning device and semiconductor cleaning method | Akira Okada, Takaya Noguchi | 2015-08-25 |
| 8981805 | Inspection apparatus and inspection method | Akira Okada, Kinya YAMASHITA | 2015-03-17 |
| 8980655 | Test apparatus and test method | Akira Okada, Takaya Noguchi, Norihiro Takesako, Kinya YAMASHITA | 2015-03-17 |
| 8975681 | Semiconductor device | Akira Okada | 2015-03-10 |
| 8823360 | Semiconductor device | Akira Okada | 2014-09-02 |
| 8609443 | Semiconductor device manufacturing method | Kazuhiro Shimizu, Naoki Yasuda | 2013-12-17 |