Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11774476 | Input capacitance measurement circuit and method of manufacturing semiconductor device | Masaki Ueno, Reona FURUKAWA | 2023-10-03 |
| 10665670 | Semiconductor device and method for manufacturing same | Kazutoyo Takano, Kazushige Matsuo, Junji Yahiro | 2020-05-26 |
| 10224388 | Wiring core structure, semiconductor evaluation device and semiconductor device | Akira Okada, Kazushige Matsuo | 2019-03-05 |
| 7057298 | Semiconductor device with semiconductor chip formed by using wide gap semiconductor as base material | Katsumi Satou, Shigeo Tooi, Kazushige Matsuo | 2006-06-06 |
| 6861730 | Semiconductor device with semiconductor chip formed by using wide gap semiconductor as base material | Katsumi Satou, Shigeo Tooi, Kazushige Matsuo | 2005-03-01 |
| 6831351 | Semiconductor device with semiconductor chip formed by using wide gap semiconductor as base material | Katsumi Satou, Shigeo Tooi, Kazushige Matsuo | 2004-12-14 |
| 6788082 | Probe card | — | 2004-09-07 |