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Fei Wang

AM AMD: 137 patents #14 of 9,279Top 1%
The Procter & Gamble: 38 patents #204 of 10,133Top 3%
Applied Materials: 15 patents #903 of 7,310Top 15%
SL Spansion Llc.: 10 patents #91 of 769Top 15%
SC Saint-Gobain Adfors Canada: 4 patents #4 of 45Top 9%
AB Asm Ip Holding B.V.: 4 patents #202 of 620Top 35%
KT Kunming University Of Science And Technology: 4 patents #12 of 279Top 5%
WARF: 3 patents #656 of 4,123Top 20%
MR Monterey Research: 2 patents #7 of 54Top 15%
Becton, Dickinson And: 2 patents #1,271 of 2,926Top 45%
Fujitsu Limited: 2 patents #10,930 of 24,456Top 45%
SP Saint-Gobain Performance Plastics: 2 patents #139 of 490Top 30%
SI Sipix Imaging: 2 patents #46 of 91Top 55%
IN International: 1 patents #41 of 85Top 50%
JH J.M. Huber: 1 patents #107 of 207Top 55%
Globalfoundries: 1 patents #2,221 of 4,424Top 55%
A( Alltop Electronics (Suzhou): 1 patents #33 of 63Top 55%
NC Ningbo Crrc Times Transducer Technology Co.: 1 patents #8 of 15Top 55%
QT Qingdao University Of Technology: 1 patents #168 of 480Top 35%
SA Saint-Gobain Abrasifs: 1 patents #184 of 340Top 55%
SA Saint-Gobain Abrasives: 1 patents #204 of 367Top 60%
FL Fujitsu Amd Semiconductor Limited: 1 patents #14 of 40Top 35%
Cypress Semiconductor: 1 patents #1,072 of 1,852Top 60%
SC Shanghai Huachang Environmental Protection Co.: 1 patents #16 of 45Top 40%
SU Sichuan University: 1 patents #191 of 663Top 30%
Caltech: 1 patents #2,143 of 4,321Top 50%
EM Embecta: 1 patents #37 of 76Top 50%
University Of Texas System: 1 patents #2,951 of 6,559Top 45%
Infineon Technologies Ag: 1 patents #4,439 of 7,486Top 60%
📍 Mason, OH: #3 of 1,011 inventorsTop 1%
🗺 Ohio: #24 of 73,341 inventorsTop 1%
Overall (All Time): #2,214 of 4,157,543Top 1%
240
Patents All Time

Issued Patents All Time

Showing 151–175 of 240 patents

Patent #TitleCo-InventorsDate
6475929 Method of manufacturing a semiconductor structure with treatment to sacrificial stop layer producing diffusion to an adjacent low-k dielectric layer lowering the constant Calvin T. Gabriel, Suzette K. Pangrle, Lynne A. Okada 2002-11-05
6472317 Dual damascene arrangement for metal interconnection with low k dielectric constant materials in dielectric layers Jerry Cheng, Simon S. Chan, Todd P. Lukanc 2002-10-29
6465361 Method for preventing damage of low-k dielectrics during patterning Lu You, Steve Avanzino 2002-10-15
6465340 Via filled dual damascene structure with middle stop layer and method for making the same Lynne A. Okada, Ramkumar Subramanian, Calvin T. Gabriel 2002-10-15
6465343 Method for forming backend interconnect with copper etching and ultra low-k dielectric materials 2002-10-15
6465889 Silicon carbide barc in dual damascene processing Ramkumar Subramanian, Lynne A. Okada, Calvin T. Gabriel, Darrell M. Erb 2002-10-15
6454916 Selective electroplating with direct contact chemical polishing Steven C. Avanzino, Darrell M. Erb 2002-09-24
6444573 Method of making a slot via filled dual damascene structure with a middle stop layer Lynne A. Okada, Ramkumar Subramanian, Calvin T. Gabriel 2002-09-03
6444530 Process for fabricating an integrated circuit with a self-aligned contact Hung-Sheng Chen, Unsoon Kim, Yu Sun, Chi Chang, Mark T. Ramsbey +4 more 2002-09-03
6440640 Thin resist with transition metal hard mask for via etch application Chih-Yuh Yang, Christopher F. Lyons, Harry J. Levinson, Khanh B. Nguyen, Scott A. Bell 2002-08-27
6436766 Process for fabricating high density memory cells using a polysilicon hard mask Bharath Rangarajan, David K. Foote, Dawn Hopper, Stephen Keetai Park, Jack F. Thomas +2 more 2002-08-20
6429116 Method of fabricating a slot dual damascene structure without middle stop layer Lynne A. Okada, Ramkumar Subramanian, Calvin T. Gabriel 2002-08-06
6423612 Method of fabricating a shallow trench isolation structure with reduced topography Wenge Yang, John Jianshi Wang 2002-07-23
6424039 Dual damascene process using sacrificial spin-on materials Bhanwar Singh, James Kai 2002-07-23
6420752 Semiconductor device with self-aligned contacts using a liner oxide layer Minh Van Ngo, Yu Sun, Mark T. Ramsbey, Chi Chang, Angela T. Hui +1 more 2002-07-16
6416620 Method of repulping repulpable and recyclable moisture resistant coated articles Radi Narancic, Gary M. Freeman, Eve De LaVega-Irvine 2002-07-09
6417090 Damascene arrangement for metal interconnection using low k dielectric constant materials for etch stop layer Lu You 2002-07-09
6399446 Process for fabricating high density memory cells using a metallic hard mask Bharath Rangarajan, David K. Foote, Dawn Hopper, Stephen Keetai Park, Jack F. Thomas +2 more 2002-06-04
6399480 Methods and arrangements for insulating local interconnects for improved alignment tolerance and size reduction William G. En, Darin A. Chan, David K. Foote, Minh Van Ngo 2002-06-04
6400030 Self-aligning vias for semiconductors Robin Cheung, Mark S. Chang, Richard J. Huang, Angela T. Hui 2002-06-04
6391766 Method of making a slot via filled dual damascene structure with middle stop layer Lynne A. Okada, Ramkumar Subramanian, Calvin T. Gabriel 2002-05-21
6383919 Method of making a dual damascene structure without middle stop layer Lynne A. Okada, Ramkumar Subramanian, Calvin T. Gabriel 2002-05-07
6380091 Dual damascene arrangement for metal interconnection with oxide dielectric layer and low K dielectric constant layer Jerry Cheng, Darrell M. Erb 2002-04-30
6376389 Method for eliminating anti-reflective coating in semiconductors Ramkumar Subramanian, Minh Van Ngo, Kashmir Sahota, YongZhong Hu, Hiroyuki Kinoshita +1 more 2002-04-23
6376308 Process for fabricating an EEPROM device having a pocket substrate region David K. Foote, Bharath Rangarajan, George J. Kluth 2002-04-23