Issued Patents All Time
Showing 25 most recent of 28 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11809684 | Coordinated display of software application interfaces | Shuai Li | 2023-11-07 |
| 11768930 | Application authenticity verification in digital distribution systems | — | 2023-09-26 |
| 11729295 | Dynamic link processing engine | Shuai Li | 2023-08-15 |
| 11550863 | Spatially dynamic document retrieval | Shuai Li | 2023-01-10 |
| 11418382 | Method of cooperative active-standby failover between logical routers based on health of attached services | Haihua Luo, Kai-Wei Fan, Michael Hu | 2022-08-16 |
| 11231921 | Software application update management engine | Alexander Decker, Bharath Booshan Lakshmi Narayanan, Shuai Li, Nikita Leonov, Rene Cacheaux +1 more | 2022-01-25 |
| 11025742 | Dynamic link processing engine | Shuai Li | 2021-06-01 |
| 11003757 | Application authenticity verification in digital distribution systems | — | 2021-05-11 |
| 10977060 | Native execution bridge for sandboxed scripting languages | Kapil Sukhyani, Shilpa Modi, Shuai Li, Noam Bar-on, Bharath Booshan +1 more | 2021-04-13 |
| 10942625 | Coordinated display of software application interfaces | Shuai Li | 2021-03-09 |
| 10719600 | Application authenticity verification in digital distribution systems | — | 2020-07-21 |
| 10394584 | Native execution bridge for sandboxed scripting languages | Kapil Sukhyani, Shilpa Modi, Shuai Li, Noam Bar-on, Bharath Booshan +1 more | 2019-08-27 |
| 8862610 | Method and system for content search | Erik Nis Jessen, Eric Hennings | 2014-10-14 |
| 8060510 | Best fit map searching | Joy Ghanekar, Denis Hänikel | 2011-11-15 |
| 6759179 | Methods and systems for controlling resist residue defects at gate layer in a semiconductor device manufacturing process | Khoi A. Phan, Jeffrey P. Erhardt, Richard Bartlett, Anthony P. Coniglio, Wolfram Grundke +3 more | 2004-07-06 |
| 6756300 | Method for forming dual damascene interconnect structure | Fei Wang, Lynne A. Okada, Minh Quoc Tran, Lu You | 2004-06-29 |
| 6649525 | Methods and systems for controlling resist residue defects at gate layer in a semiconductor device manufacturing process | Khoi A. Phan, Jeffrey P. Erhardt, Richard Bartlett, Anthony P. Coniglio, Wolfram Grundke +3 more | 2003-11-18 |
| 6472317 | Dual damascene arrangement for metal interconnection with low k dielectric constant materials in dielectric layers | Fei Wang, Simon S. Chan, Todd P. Lukanc | 2002-10-29 |
| 6380091 | Dual damascene arrangement for metal interconnection with oxide dielectric layer and low K dielectric constant layer | Fei Wang, Darrell M. Erb | 2002-04-30 |
| 6291887 | Dual damascene arrangements for metal interconnection with low k dielectric constant materials and nitride middle etch stop layer | Fei Wang, Todd P. Lukanc | 2001-09-18 |
| 6255735 | Dual damascene arrangement for metal interconnection with low k dielectric constant materials in dielectric layers | Fei Wang, Simon S. Chan, Todd P. Lukanc | 2001-07-03 |
| 6235628 | Method of forming dual damascene arrangement for metal interconnection with low k dielectric constant materials and oxide middle etch stop layer | Fei Wang | 2001-05-22 |
| 6207576 | Self-aligned dual damascene arrangement for metal interconnection with low k dielectric constant materials and oxide etch stop layer | Fei Wang | 2001-03-27 |
| 6207577 | Self-aligned dual damascene arrangement for metal interconnection with oxide dielectric layer and low k dielectric constant layer | Fei Wang, Darrell M. Erb | 2001-03-27 |
| D434595 | Electric ice-scraping machine | — | 2000-12-05 |