MM

Matthias Manger

CG Carl Zeiss Smt Gmbh: 21 patents #60 of 1,189Top 6%
CS Carl Zeiss Sms: 2 patents #40 of 118Top 35%
SA Siemens Aktiengesellschaft: 2 patents #6,658 of 22,248Top 30%
📍 Neukochen, DE: #1 of 3 inventorsTop 35%
Overall (All Time): #158,562 of 4,157,543Top 4%
25
Patents All Time

Issued Patents All Time

Showing 1–25 of 25 patents

Patent #TitleCo-InventorsDate
12372877 Projection exposure apparatus for semiconductor lithography Markus Raab, Andreas Raba, Mirko Buechsenschuetz 2025-07-29
12276916 Drive device, optical system and lithography apparatus Michel Aliman, Lars Berger, Mohammad Awad 2025-04-15
12130557 Optical system and lithography apparatus Markus Raab 2024-10-29
11920977 Metrology system and method for measuring an excitation laser beam in an EUV plasma source Florian Baumer 2024-03-05
11737199 Device and method for measuring the beam angle of a light beam guided by a beam guiding optical unit Florian Baumer 2023-08-22
11415892 Method for producing a reflecting optical element of a projection exposure apparatus and reflecting optical element for a projection exposure apparatus, projection lens and projection exposure apparatus Matthias KAES, Steffen Bezold, Christoph Petri, Pavel Alexeev, Walter Pauls 2022-08-16
11274914 Measuring assembly for the frequency-based determination of the position of a component Andreas Koeniger, Alexander Vogler 2022-03-15
11099400 Beam propagation camera and method for light beam analysis 2021-08-24
11054305 Method and device for beam analysis Christoph Husemann, Matus Kalisky, Lars Stoppe 2021-07-06
11048172 Method for producing an illumination system for an EUV projection exposure system, and illumination system Juergen Baier, Daniel Runde, Ulrich Mueller, Joerg Lichtenthaeler, André Orthen +3 more 2021-06-29
D914612 Electrical junction box for motor diagnosis Jan Andersson, Stephan Hühne, Michael Weigand 2021-03-30
10605654 Method and device for beam analysis Christoph Husemann, Matus Kalisky, Lars Stoppe 2020-03-31
10514608 Method for producing an illumination system for an EUV projection exposure system, and illumination system Juergen Baier, Daniel Runde, Ulrich Mueller, Joerg Lichtenthaeler, André Orthen +3 more 2019-12-24
D863226 Electrical junction box for motor diagnosis Jan Andersson, Stephan Hühne 2019-10-15
9823119 System and method for analyzing a light beam guided by a beam guiding optical unit Florian Baumer 2017-11-21
9720328 Projection exposure system for microlithography and method of monitoring a lateral imaging stability Armin Rauthe-Schoech, Ulrich Mueller 2017-08-01
9235142 Projection exposure system for microlithography and method of monitoring a lateral imaging stability Armin Rauthe-Schoech, Ulrich Mueller 2016-01-12
8786849 Method for measuring an optical system Thomas Korb, Christian Hettich, Michael Layh, Ulrich Wegmann, Karl-Heinz Schuster 2014-07-22
8593642 Method of measuring a shape of an optical surface based on computationally combined surface region measurements and interferometric measuring device Rolf Freimann, Bernd Doerband, Stefan Schulte, Albrecht Hof, Frank Riepenhausen +3 more 2013-11-26
8473237 Method for calibrating a specimen stage of a metrology system and metrology system comprising a specimen stage Alexander Huebel, Gerd Klose, Uwe Schellhorn, Michael Arnz 2013-06-25
8456616 Optical system for microlithography Daniel Kraehmer, Wilhelm Ulrich, Bernhard Gellrich 2013-06-04
8416412 Method for determination of residual errors Uwe Schellhorn 2013-04-09
7760345 Method and apparatus for determining at least one optical property of an imaging optical system Markus Goeppert, Gordon Doering, Alfred Gatzweiler 2010-07-20
7755748 Device and method for range-resolved determination of scattered light, and an illumination mask Michael Arnz, Oswald Gromer, Gerd Klose, Joachim Stuehler 2010-07-13
7408631 Device for the range-resolved determination of scattered light, operating method, illumination mask and image-field mask Michael Arnz, Oswald Gromer, Gerd Klose, Joachim Stuehler 2008-08-05