JS

Joachim Stuehler

CG Carl Zeiss Smt Gmbh: 11 patents #135 of 1,189Top 15%
Overall (All Time): #459,317 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #TitleCo-InventorsDate
10114293 Illumination system and projection objective of a mask inspection apparatus Heiko Feldmann, Erik Matthias Sohmen, Oswald Gromer, Ulrich Mueller, Michael Layh +1 more 2018-10-30
10042271 Projection exposure system for microlithography with a measurement device Ulrich Mueller, Oswald Gromer, Rolf Freimann, Paul Kaufmann, Bernhard Geuppert 2018-08-07
9696639 Projection exposure system for microlithography with a measurement device Ulrich Mueller, Oswald Gromer, Rolf Freimann, Paul Kaufmann, Bernhard Geuppert 2017-07-04
9001304 Projection exposure system for microlithography with a measurement device Ulrich Mueller, Oswald Gromer, Rolf Freimann, Paul Kaufmann, Bernhard Geuppert 2015-04-07
8988752 Beam control apparatus for an illumination beam and metrology system comprising an optical system containing such a beam control apparatus Marten Krebs, Gerhard Huber, Uwe Schellhorn 2015-03-24
8836929 Device and method for the optical measurement of an optical system by using an immersion fluid Ulrich Wegmann, Uwe Shellhorn, Albrecht Ehrmann, Martin Schriever, Markus Goeppert +1 more 2014-09-16
8120763 Device and method for the optical measurement of an optical system by using an immersion fluid Ulrich Wegmann, Uwe Schellhorn, Albrecht Ehrmann, Martin Schriever, Markus Goeppert +1 more 2012-02-21
7755748 Device and method for range-resolved determination of scattered light, and an illumination mask Michael Arnz, Oswald Gromer, Gerd Klose, Matthias Manger 2010-07-13
7408631 Device for the range-resolved determination of scattered light, operating method, illumination mask and image-field mask Michael Arnz, Oswald Gromer, Gerd Klose, Matthias Manger 2008-08-05
7408652 Device and method for the optical measurement of an optical system by using an immersion fluid Ulrich Wegmann, Uwe Schellhorn, Helmut Haidner, Albrecht Ehrmann, Martin Schriever +1 more 2008-08-05
7019824 Moire method and measuring system for measuring the distortion of an optical imaging system Ulrich Wegmann, Uwe Schellhorn, Ralph Klaesges 2006-03-28