Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12276916 | Drive device, optical system and lithography apparatus | Matthias Manger, Lars Berger, Mohammad Awad | 2025-04-15 |
| 12176199 | Ionization device and mass spectrometer | Yessica Brachthaeuser, Thorsten Benter, Marco Thinius | 2024-12-24 |
| 11935734 | Ion trap with ring-shaped ion storage cell and mass spectrometer | Yessica Brachthauser, Alexander Laue, Anthony Hin Yiu Chung | 2024-03-19 |
| 11791147 | Mass spectrometer and method for analysing a gas by mass spectrometry | Anthony Hin Yiu Chung, Thorsten Benter, Rudiger Reuter, Yessica Brachthaeuser | 2023-10-17 |
| 11107670 | Method for analyzing a gas by mass spectrometry, and mass spectrometer | Alexander Laue, Andreas Schuetz, Ruediger Reuter | 2021-08-31 |
| 10903060 | Method for mass spectrometric examination of gas mixtures and mass spectrometer therefor | Hin Yiu Anthony Chung, Gennady Fedosenko, Albrecht Ranck | 2021-01-26 |
| 10304672 | Mass spectrometer, use thereof, and method for the mass spectrometric examination of a gas mixture | Gennady Fedosenko, Hin Yiu Anthony Chung, Albrecht Ranck, Leonid Gorkhover | 2019-05-28 |
| 10236169 | Ionization device with mass spectrometer therewith | Hin Yiu Anthony Chung, Gennady Fedosenko, Ruediger Reuter, Alexander Laue, Achim von Keudell +5 more | 2019-03-19 |
| 10141174 | Method for examining a gas by mass spectrometry and mass spectrometer | Alexander Laue, Hin Yiu Anthony Chung, Gennady Fedosenko, Ruediger Reuter, Leonid Gorkhover +3 more | 2018-11-27 |
| 9947504 | Particle beam apparatus and method for operating a particle beam apparatus | Klaus Hegele, Edgar Fichter, Dirk Preikszas, Christian Hendrich, Momme Mommsen +2 more | 2018-04-17 |
| 9230789 | Printed circuit board multipole for ion focusing | Alexander Laue, Albrecht Glasmachers, Christian Hendrich, Dirk Preikszas, Hubert Mantz +2 more | 2016-01-05 |
| 9035245 | Device for mass selective determination of an ion | Albrecht Glasmachers | 2015-05-19 |
| 8766219 | Particle beam microscope for generating material data | Jaroslaw Paluszynski, Wolfgang Berger | 2014-07-01 |