Issued Patents All Time
Showing 51–75 of 129 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7501625 | Electron microscope application apparatus and sample inspection method | Hikaru Koyama, Hiroshi Makino | 2009-03-10 |
| 7491933 | Electron beam apparatus | Hideo Todokoro | 2009-02-17 |
| 7462828 | Inspection method and inspection system using charged particle beam | Atsuko Fukada, Naomasa Suzuki, Hidetoshi Nishiyama, Muneyuki Fukuda, Noritsugu Takahashi | 2008-12-09 |
| 7459683 | Charged particle beam device with DF-STEM image valuation method | Mine Araki, Shunya Watanabe, Chisato Kamiya, Atsushi Takane, Akinari Morikawa +2 more | 2008-12-02 |
| 7456403 | Charged particle beam device | Yuusuke Tanba, Kaname Takahashi, Shunya Watanabe, Mine Nakagawa, Atsushi Muto | 2008-11-25 |
| 7449690 | Inspection method and inspection apparatus using charged particle beam | Hidetoshi Nishiyama, Muneyuki Fukuda, Noritsugu Takahashi, Atsuko Fukada, Naomasa Suzuki | 2008-11-11 |
| 7442929 | Scanning electron microscope | Hirohiko Kitsuki, Kazuo Aoki | 2008-10-28 |
| 7439506 | Method and an apparatus of an inspection system using an electron beam | Yuko Iwabuchi, Hideo Todokoro, Hiroyoshi Mori, Yasutsugu Usami, Mikio Ichihashi +6 more | 2008-10-21 |
| 7435957 | Charged particle beam equipment and charged particle microscopy | Hiromi Inada, Atsushi Takane | 2008-10-14 |
| 7425702 | Charged particle beam apparatus | Yuko Sasaki | 2008-09-16 |
| 7408172 | Charged particle beam apparatus and charged particle beam irradiation method | Hideo Todokoro, Yoichi Ose, Makoto Ezumi, Noriaki Arai, Takashi Doi | 2008-08-05 |
| 7385196 | Method and scanning electron microscope for measuring width of material on sample | Goroku Shimoma, Tadashi Otaka, Hideo Todokoro, Shunichi Watanabe, Tadanori Takahashi +3 more | 2008-06-10 |
| 7381968 | Charged particle beam apparatus and specimen holder | Hiroyuki Tanaka, Masashi Sasaki, Yoshifumi Taniguchi | 2008-06-03 |
| 7375330 | Charged particle beam equipment | Hiromi Inada, Hiroyuki Tanaka, Shun-ichi Watanabe, Shigeto Isakozawa, Atsushi Takane +1 more | 2008-05-20 |
| 7372047 | Charged particle system and a method for measuring image magnification | Atsushi Takane, Shigeto Isakozawa, Takashi Iizumi, Tatsuya Maeda, Hiromi Inada | 2008-05-13 |
| 7361894 | Method of forming a sample image and charged particle beam apparatus | Atsushi Takane, Takashi Iizumi, Tadashi Otaka, Hideo Todokoro, Satoru Yamaguchi +1 more | 2008-04-22 |
| 7355174 | Charged particle beam emitting device and method for adjusting the optical axis | Makoto Ezumi, Satoru Yamaguchi | 2008-04-08 |
| 7355177 | Electron beam device | Chisato Kamiya, Masahiro Akatsu | 2008-04-08 |
| 7348559 | Defect inspection and charged particle beam apparatus | Toshihide Agemura | 2008-03-25 |
| 7340111 | Image evaluation method and microscope | Tohru Ishitani, Hideo Todokoro, Tadashi Otaka, Takashi Iizumi, Atsushi Takane | 2008-03-04 |
| 7339167 | Charged particle beam apparatus | Takashi Ohshima, Soichi Katagiri | 2008-03-04 |
| 7329868 | Charged particle beam apparatus | Atsushi Takane, Haruo Yoda, Hideo Todokoro, Fumio Mizuno, Shoji Yoshida +2 more | 2008-02-12 |
| 7315024 | Monochromator and scanning electron microscope using the same | Yoichi Ose, Shunroku Taya, Hideo Todokoro, Tadashi Otaka, Makoto Ezumi | 2008-01-01 |
| 7282722 | Charged particle beam apparatus and charged particle beam irradiation method | Hideo Todokoro, Yoichi Ose, Makoto Ezumi, Noriaki Arai, Takashi Doi | 2007-10-16 |
| 7236651 | Image evaluation method and microscope | Tohru Ishitani, Hideo Todokoro, Tadashi Otaka, Takashi Iizumi, Atsushi Takane | 2007-06-26 |