Issued Patents All Time
Showing 1–23 of 23 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7928376 | Element mapping unit, scanning transmission electron microscope, and element mapping method | Kazutoshi Kaji, Kazuhiro Ueda, Koji Kimoto, Takashi Aoyama, Shigeto Isakozawa | 2011-04-19 |
| 7838827 | Monochromator and scanning electron microscope using the same | Yoichi Ose, Hideo Todokoro, Tadashi Otaka, Mitsugu Sato, Makoto Ezumi | 2010-11-23 |
| 7315024 | Monochromator and scanning electron microscope using the same | Yoichi Ose, Hideo Todokoro, Tadashi Otaka, Mitsugu Sato, Makoto Ezumi | 2008-01-01 |
| 7250601 | Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method | Kazutoshi Kaji, Takashi Aoyama, Shigeto Isakozawa | 2007-07-31 |
| 7067805 | Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method | Kazutoshi Kajl, Takashi Aoyama, Shigeto Isakozawa | 2006-06-27 |
| 7022983 | Monochromator and scanning electron microscope using the same | Yoichi Ose, Hideo Todokoro, Tadashi Otaka, Mitsugu Sato, Makoto Ezumi | 2006-04-04 |
| 6933501 | Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method | Kazutoshi Kaji, Takashi Aoyama, Hiroyuki Tanaka, Shigeto Isakozawa | 2005-08-23 |
| 6794648 | Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method | Kazutoshi Kaji, Takashi Aoyama, Hiroyuki Tanaka, Shigeto Isakozawa | 2004-09-21 |
| 6703613 | Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method | Kazutoshi Kaji, Takashi Aoyama, Shigeto Isakozawa | 2004-03-09 |
| 6310341 | Projecting type charged particle microscope and projecting type substrate inspection system | Hideo Todokoro, Tohru Ishitani, Yasutsugu Usami, Hiroyuki Shinada, Taku Ninomiya +1 more | 2001-10-30 |
| 6150657 | Energy filter and electron microscope equipped with the energy filter | Koji Kimoto, Yoshifumi Taniguchi, Shigeto Isakozawa, Takashi Aoyama, Masakazu Saito +1 more | 2000-11-21 |
| 6066852 | Electron energy filter | Yoshifumi Taniguchi | 2000-05-23 |
| 5585630 | Electron energy filter and transmission electron microscope provided with the same | Yoshifumi Taniguchi | 1996-12-17 |
| 5291016 | Electrostatic lens arrangement of multi-stages of multi-pole electrodes and mass spectrometer using the same | — | 1994-03-01 |
| 4972083 | Post-acceleration detector for mass spectrometer | Minoru Uchida, Akiyoshi Yasuda | 1990-11-20 |
| 4947041 | Analyzer tube for mass spectrometry | — | 1990-08-07 |
| 4870283 | Electric multipole lens | — | 1989-09-26 |
| 4839523 | Ion implantation apparatus for semiconductor manufacture | Katsunobu Abe, Atsushi Shibata | 1989-06-13 |
| 4703180 | Microwave discharge type ion source for ion injection devices | — | 1987-10-27 |
| 4634931 | Ion implanter | Susumu Kozasa | 1987-01-06 |
| 4629930 | Plasma ion source | Noriyuki Sakudo, Osami Okada, Susumu Ozasa, Katsumi Tokiguchi, Hidemi Koike +2 more | 1986-12-16 |
| 4599516 | Specimens rotating device | Takeshi Koike, Mitsuo Komatsu | 1986-07-08 |
| 4476393 | Ion implantation apparatus | Mituo Fujiwara | 1984-10-09 |