Issued Patents All Time
Showing 25 most recent of 41 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10955431 | Automatic analysis device with syringe pump | Kenichi Hirami, Hajime Yamazaki, Eriko Otsu | 2021-03-23 |
| 8796651 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Tohru Ishitani, Kaoru Umemura, Eiichi Seya, Mitsuo Tokuda +3 more | 2014-08-05 |
| 8618520 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Satoshi Tomimatsu, Hiroyasu Shichi +2 more | 2013-12-31 |
| 8222618 | Method and apparatus for processing a microsample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Satoshi Tomimatsu, Hiroyasu Shichi +2 more | 2012-07-17 |
| 8156852 | Cutting plotter, cutting plotter driving control device, cut target medium supporting sheet, cut target medium, cutting pen, method of manufacturing paper product, and method of generating cut data | Takeya Shibata, Yuzuru Sekiguchi, Michiharu Nishijima, Tsutomu Tsuji, Yutaka Saegusa +5 more | 2012-04-17 |
| 7897936 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Tohru Ishitani, Kaoru Umemura, Eiichi Seya, Mitsuo Tokuda +3 more | 2011-03-01 |
| 7888639 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Satoshi Tomimatsu, Hiroyasu Shichi +2 more | 2011-02-15 |
| 7550750 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Satoshi Tomimatsu, Hiroyasu Shichi +2 more | 2009-06-23 |
| 7470918 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Satoshi Tomimatsu, Hiroyasu Shichi +2 more | 2008-12-30 |
| 7465945 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Satoshi Tomimatsu, Hiroyasu Shichi +2 more | 2008-12-16 |
| 7301146 | Probe driving method, and probe apparatus | Satoshi Tomimatsu, Junzo Azuma, Tohru Ishitani, Aritoshi Sugimoto, Yuichi Hamamura +2 more | 2007-11-27 |
| 7268356 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Tohru Ishitani, Kaoru Umemura, Eiichi Seya, Mitsuo Tokuda +3 more | 2007-09-11 |
| 7205554 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Satoshi Tomimatsu, Hiroyasu Shichi +2 more | 2007-04-17 |
| 7205560 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Satoshi Tomimatsu, Hiroyasu Shichi +2 more | 2007-04-17 |
| 7146872 | Micro manipulator | Kazuhiro Morita, Motohide Ukiana, Kazuhiro Fujii, Shigeto Isakozawa, Tamio Tanikawa | 2006-12-12 |
| 6970004 | Apparatus for inspecting defects of devices and method of inspecting defects | Tohru Ishitani, Aritoshi Sugimoto, Isamu Sekihara, Kaoru Umemura, Satoshi Tomimatsu +1 more | 2005-11-29 |
| 6960765 | Probe driving method, and probe apparatus | Satoshi Tomimatsu, Junzo Azuma, Tohru Ishitani, Aritoshi Sugimoto, Yuichi Hamamura +2 more | 2005-11-01 |
| 6927391 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Satoshi Tomimatsu, Hiroyasu Shichi +2 more | 2005-08-09 |
| 6794663 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Tohru Ishitani, Kaoru Umemura, Eiichi Seya, Mitsuo Tokuda +3 more | 2004-09-21 |
| 6781125 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Satoshi Tomimatsu, Hiroyasu Shichi +2 more | 2004-08-24 |
| 6734687 | Apparatus for detecting defect in device and method of detecting defect | Tohru Ishitani, Aritoshi Sugimoto, Isamu Sekihara, Kaoru Umemura, Satoshi Tomimatsu +1 more | 2004-05-11 |
| 6717156 | Beam as well as method and equipment for specimen fabrication | Masakazu Sugaya, Hiroyasu Shichi, Muneyuki Fukuda, Kaoru Umemura | 2004-04-06 |
| 6664552 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Tohru Ishitani, Kaoru Umemura, Eiichi Seya, Mitsuo Tokuda +3 more | 2003-12-16 |
| 6627889 | Apparatus and method for observing sample using electron beam | Isao Ochiai, Satoshi Tomimatsu, Muneyuki Fukuda, Mitsugu Sato, Tohru Ishitani | 2003-09-30 |
| 6566654 | Inspection of circuit patterns for defects and analysis of defects using a charged particle beam | Ryuichi Funatsu, Shigeto Isakozawa | 2003-05-20 |