Issued Patents All Time
Showing 25 most recent of 93 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12394041 | System for deriving electrical characteristics and non-transitory computer-readable medium | Heita Kimizuka, Yohei Nakamura, Natsuki Tsuno | 2025-08-19 |
| 12001521 | Adjusting method of charged particle beam device and charged particle beam device system | Heita Kimizuka, Natsuki Tsuno | 2024-06-04 |
| 11852599 | Image processing system | Nobuhiro Okai, Naomasa Suzuki | 2023-12-26 |
| 11749494 | Charged particle beam apparatus | Takafumi Miwa, Yohei Nakamura, Natsuki Tsuno, Heita Kimizuka | 2023-09-05 |
| 11694325 | System for deriving electrical characteristics and non-transitory computer-readable medium | Heita Kimizuka, Yohei Nakamura, Natsuki Tsuno | 2023-07-04 |
| 11646172 | Charged particle beam apparatus | Takafumi Miwa, Yohei Nakamura, Natsuki Tsuno, Heita Kimizuka | 2023-05-09 |
| 11631568 | Device defect detection method using a charged particle beam | Yasuhiro Shirasaki, Natsuki Tsuno, Minami Shouji, Yohei Nakamura | 2023-04-18 |
| 11501950 | Charged particle beam device | Yohei Minekawa, Kohei Chiba, Takanori Kishimoto | 2022-11-15 |
| 11398366 | Charged particle beam apparatus | Takafumi Miwa, Yohei Nakamura, Natsuki Tsuno, Heita Kimizuka | 2022-07-26 |
| 11398367 | Charged particle beam apparatus | Takafumi Miwa, Yohei Nakamura, Natsuki Tsuno, Heita Kimizuka | 2022-07-26 |
| 11355308 | Charged particle beam device | Yasuhiro Shirasaki, Natsuki Tsuno, Minami Shouji, Yohei Nakamura | 2022-06-07 |
| 11335535 | Charged particle beam apparatus | Yohei Nakamura, Takafumi Miwa, Heita Kimizuka, Natsuki Tsuno | 2022-05-17 |
| 11328897 | Charged particle beam device | Minami Shouji, Natsuki Tsuno, Yasuhiro Shirasaki, Satoshi Takada | 2022-05-10 |
| 11232929 | Method for determining irradiation conditions for charged particle beam device and charged particle beam device | Heita Kimizuka, Natsuki Tsuno, Katsura Takaguchi | 2022-01-25 |
| 11211224 | Charged particle beam apparatus | Nobuhiro Okai, Daisuke Bizen, Tomoyasu Shojo, Naomasa Suzuki | 2021-12-28 |
| 11043359 | Charged particle beam apparatus and charged particle beam inspection system | Yohei Nakamura, Natsuki Tsuno, Heita Kimizuka, Takafumi Miwa, Junichi Tanaka | 2021-06-22 |
| 10879037 | Charged particle beam device with distance setting between irradiation regions in a scan line | Natsuki Tsuno, Naomasa Suzuki, Atsushi Okita | 2020-12-29 |
| 10714304 | Charged particle beam apparatus | Yoshinori Momonoi, Akihiro Miura, Fumihiro Sasajima, Hiroaki Mito | 2020-07-14 |
| 10340115 | Charged particle beam apparatus | Yoshinori Momonoi, Akihiro Miura, Fumihiro Sasajima, Hiroaki Mito | 2019-07-02 |
| 10101150 | Height measurement device and charged particle beam device | Hiroki Kawada, Yoshinori Momonoi, Shou Takami | 2018-10-16 |
| 10037866 | Charged particle beam apparatus | Momoyo Enyama, Hideyuki Kazumi, Koichi Hamada, Sayaka Tanimoto | 2018-07-31 |
| 9892887 | Charged particle beam apparatus | Yoshinori Momonoi, Akihiro Miura, Fumihiro Sasajima, Hiroaki Mito | 2018-02-13 |
| 9644955 | Scanning electron beam device with focus adjustment based on acceleration voltage and dimension measurement method using same | Tasuku Yano, Yasunari Sohda, Katsunori Onuki, Hajime Kawano, Naomasa Suzuki | 2017-05-09 |
| 9384940 | Charged particle beam apparatus | Naomasa Suzuki, Akira Ikegami, Hideto Dohi, Momoyo Enyama, Tomoyasu Shojo | 2016-07-05 |
| 9312091 | Charged particle beam apparatus | Yasunari Sohda, Tasuku Yano, Noritsugu Takahashi, Hajime Kawano, Hiroyuki Ito | 2016-04-12 |