Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12196802 | Semiconductor inspection device and method for inspecting semiconductor sample | Yasuhiro Shirasaki, Natsuki Tsuno, Makoto Sakakibara, Satoshi Takada | 2025-01-14 |
| 11869745 | Charged particle beam device | Natsuki Tsuno, Hiroya Ohta, Daisuke Bizen | 2024-01-09 |
| 11631568 | Device defect detection method using a charged particle beam | Yasuhiro Shirasaki, Natsuki Tsuno, Yohei Nakamura, Muneyuki Fukuda | 2023-04-18 |
| 11393657 | Electron beam device | Natsuki Tsuno, Toshihide Agemura | 2022-07-19 |
| 11355308 | Charged particle beam device | Yasuhiro Shirasaki, Natsuki Tsuno, Yohei Nakamura, Muneyuki Fukuda | 2022-06-07 |
| 11328897 | Charged particle beam device | Natsuki Tsuno, Yasuhiro Shirasaki, Muneyuki Fukuda, Satoshi Takada | 2022-05-10 |
| 10134564 | Charged particle beam device | Taiga Okumura, Takashi Ohshima, Yuusuke OOMINAMI, Akiko Hisada, Akio Yoneyama | 2018-11-20 |
| 9812288 | Sample holder with light emitting and transferring elements for a charged particle beam apparatus | Takashi Ohshima, Yuusuke OOMINAMI, Hideo Morishita, Kunio Harada | 2017-11-07 |