Issued Patents All Time
Showing 25 most recent of 38 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12406826 | Charged particle beam device and sample observation method | Daisuke Bizen, Yasuhiro Shirasaki, Yohei Nakamura, Satoshi Takada | 2025-09-02 |
| 12394041 | System for deriving electrical characteristics and non-transitory computer-readable medium | Heita Kimizuka, Yohei Nakamura, Muneyuki Fukuda | 2025-08-19 |
| 12196802 | Semiconductor inspection device and method for inspecting semiconductor sample | Yasuhiro Shirasaki, Minami Shouji, Makoto Sakakibara, Satoshi Takada | 2025-01-14 |
| 12181513 | Inspection method | Shota Mitsugi, Yohei Nakamura, Daisuke Bizen, Junichi FUSE, Satoshi Takada | 2024-12-31 |
| 12001521 | Adjusting method of charged particle beam device and charged particle beam device system | Heita Kimizuka, Muneyuki Fukuda | 2024-06-04 |
| 11869745 | Charged particle beam device | Minami Shouji, Hiroya Ohta, Daisuke Bizen | 2024-01-09 |
| 11776103 | System for deriving electrical characteristics and non-transitory computer-readable medium | Heita Kimizuka | 2023-10-03 |
| 11749494 | Charged particle beam apparatus | Takafumi Miwa, Yohei Nakamura, Heita Kimizuka, Muneyuki Fukuda | 2023-09-05 |
| 11694325 | System for deriving electrical characteristics and non-transitory computer-readable medium | Heita Kimizuka, Yohei Nakamura, Muneyuki Fukuda | 2023-07-04 |
| 11646172 | Charged particle beam apparatus | Takafumi Miwa, Yohei Nakamura, Heita Kimizuka, Muneyuki Fukuda | 2023-05-09 |
| 11631568 | Device defect detection method using a charged particle beam | Yasuhiro Shirasaki, Minami Shouji, Yohei Nakamura, Muneyuki Fukuda | 2023-04-18 |
| 11610754 | Charged particle beam device | Katsura Takaguchi, Yohei Nakamura, Masahiro Sasajima, Toshihide Agemura | 2023-03-21 |
| 11398366 | Charged particle beam apparatus | Takafumi Miwa, Yohei Nakamura, Heita Kimizuka, Muneyuki Fukuda | 2022-07-26 |
| 11398367 | Charged particle beam apparatus | Takafumi Miwa, Yohei Nakamura, Heita Kimizuka, Muneyuki Fukuda | 2022-07-26 |
| 11393657 | Electron beam device | Minami Shouji, Toshihide Agemura | 2022-07-19 |
| 11355308 | Charged particle beam device | Yasuhiro Shirasaki, Minami Shouji, Yohei Nakamura, Muneyuki Fukuda | 2022-06-07 |
| 11335535 | Charged particle beam apparatus | Yohei Nakamura, Takafumi Miwa, Heita Kimizuka, Muneyuki Fukuda | 2022-05-17 |
| 11328897 | Charged particle beam device | Minami Shouji, Yasuhiro Shirasaki, Muneyuki Fukuda, Satoshi Takada | 2022-05-10 |
| 11232929 | Method for determining irradiation conditions for charged particle beam device and charged particle beam device | Heita Kimizuka, Muneyuki Fukuda, Katsura Takaguchi | 2022-01-25 |
| 11183362 | Charged particle beam apparatus and sample observation method using the same | Katsura Takaguchi, Masahiro Sasajima, Toshihide Agemura | 2021-11-23 |
| 11043358 | Measuring apparatus and method of setting observation condition | Ryoko Araki, Yohei Nakamura, Masahiro Sasajima, Mitsuhiro Nakamura, Toshihide Agemura | 2021-06-22 |
| 11043359 | Charged particle beam apparatus and charged particle beam inspection system | Yohei Nakamura, Heita Kimizuka, Takafumi Miwa, Muneyuki Fukuda, Junichi Tanaka | 2021-06-22 |
| 11011348 | Scanning electron microscope and sample observation method using scanning electron microscope | Daisuke Bizen, Takafumi Miwa, Makoto Sakakibara, Toshiyuki Yokosuka, Hideyuki Kazumi | 2021-05-18 |
| 10971347 | Charged particle beam apparatus | Mitsuhiro Nakamura, Hironori ITABASHI, Hirofumi Satou, Tsutomu Saito, Masahiro Sasajima +1 more | 2021-04-06 |
| 10879037 | Charged particle beam device with distance setting between irradiation regions in a scan line | Naomasa Suzuki, Atsushi Okita, Muneyuki Fukuda | 2020-12-29 |