Issued Patents All Time
Showing 1–25 of 30 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11798780 | Charged particle beam device | Chahn Lee, Hideyuki Kazumi, Hajime Kawano, Shahedul Hoque, Kumiko Shimizu +1 more | 2023-10-24 |
| 11443914 | Charged-particle beam device and cross-sectional shape estimation program | Hajime Kawano, Kouichi Kurosawa, Hideyuki Kazumi | 2022-09-13 |
| 11239052 | Charged particle beam device | Chahn Lee, Hideyuki Kazumi, Hajime Kawano, Shahedul Hoque, Kumiko Shimizu +1 more | 2022-02-01 |
| 11211226 | Pattern cross-sectional shape estimation system and program | Hirohiko Kitsuki, Daisuke Bizen, Makoto Suzuki, Yusuke Abe, Kenji Yasui +2 more | 2021-12-28 |
| 11164720 | Scanning electron microscope and calculation method for three-dimensional structure depth | Kenji Yasui, Mayuka Osaki, Makoto Suzuki, Hirohiko Kitsuki, Daisuke Bizen +1 more | 2021-11-02 |
| 11133147 | Charged particle ray device and cross-sectional shape estimation program | Hajime Kawano, Kouichi Kurosawa, Hideyuki Kazumi, Chahn Lee | 2021-09-28 |
| 11011348 | Scanning electron microscope and sample observation method using scanning electron microscope | Daisuke Bizen, Natsuki Tsuno, Takafumi Miwa, Makoto Sakakibara, Hideyuki Kazumi | 2021-05-18 |
| 10770266 | Charged particle beam device and capturing condition adjusting method in charged particle beam device | Tomohito Nakano, Yuko Sasaki, Minoru Yamazaki, Yuzuru Mochizuki | 2020-09-08 |
| 10720306 | Charged particle beam device | Chahn Lee, Hideyuki Kazumi, Hajime Kawano, Shahedul Hoque, Kumiko Shimizu +1 more | 2020-07-21 |
| 10566172 | Charged particle beam apparatus and method for adjusting imaging conditions for the same | Tomohito Nakano, Yuko Sasaki, Minoru Yamazaki, Yuzuru Mochizuki | 2020-02-18 |
| 10541103 | Charged particle beam device | Yuzuru Mizuhara, Hideyuki Kazumi, Kouichi Kurosawa, Kenichi Myochin | 2020-01-21 |
| 10446359 | Charged particle beam device | Hideyuki Kazumi, Yuzuru Mizuhara, Hajime Kawano | 2019-10-15 |
| 10290464 | Charged particle beam device and pattern measurement device | Chahn Lee, Hideyuki Kazumi, Manabu Hasegawa | 2019-05-14 |
| 10249474 | Charged particle beam device | Chahn Lee, Hideyuki Kazumi, Hajime Kawano, Shahedul Hoque, Kumiko Shimizu +1 more | 2019-04-02 |
| 9786468 | Charged particle beam device | Chahn Lee, Hideyuki Kazumi | 2017-10-10 |
| 9697987 | Charged particle beam device | Chahn Lee, Hideyuki Kazumi, Hajime Kawano, Shahedul Hoque, Kumiko Shimizu +1 more | 2017-07-04 |
| 9640366 | Electron beam irradiation method and scanning electron microscope | Minoru Yamazaki, Hideyuki Kazumi, Kazutami Tago | 2017-05-02 |
| 9472376 | Scanning electron microscope | Chahn Lee, Hideyuki Kazumi, Hiroshi Makino, Yuzuru Mizuhara, Miki Isawa +2 more | 2016-10-18 |
| 9257259 | Electron beam irradiation method and scanning electronic microscope | Kinya Kobayashi, Chahn Lee | 2016-02-09 |
| 8907279 | Electron microscope and image capturing method using electron beam | Natsuki Tsuno, Hideyuki Kazumi, Yuzuru Mochizuki, Takafumi Miwa, Yoshinobu Kimura | 2014-12-09 |
| 8659243 | Charged particle accelerator | Hiroshi Morita, Ryozo Takeuchi | 2014-02-25 |
| 8067907 | Charged particle accelerator | Hiroshi Morita, Ryozo Takeuchi | 2011-11-29 |
| 7932486 | Mass spectrometer system | Akihiro Sano, Atsumu Hirabayashi, Yasushi Terui, Kinya Kobayashi, Kiyomi Yoshinari +1 more | 2011-04-26 |
| 7595484 | Mass spectrometric method, mass spectrometric system, diagnosis system, inspection system, and mass spectrometric program | Kinya Kobayashi, Kiyomi Yoshinari, Atsushi Otake, Atsumu Hirabayashi, Yasushi Terui | 2009-09-29 |
| 7544930 | Tandem type mass analysis system and method | Kiyomi Yoshinari, Yasushi Terui, Kinya Kobayashi, Atsumu Hirabayashi | 2009-06-09 |