Issued Patents All Time
Showing 1–25 of 85 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12394586 | Charged particle beam device | Makoto Sakakibara, Momoyo Enyama, Makoto Suzuki, Kenji Tanimoto, Yuko Sasaki | 2025-08-19 |
| 12385861 | Charged particle detector, charged particle ray device, radiation detector, and radiation detection device | Takumu IWANAKA, Yoshifumi Sekiguchi, Toshiaki Kusunoki, Shin Imamura | 2025-08-12 |
| 12205790 | Charged particle beam device | Momoyo Enyama, Makoto Sakakibara, Hiroya Ohta | 2025-01-21 |
| 12125667 | Charged particle beam device | Yasuhiro Shirasaki, Makoto Sakakibara, Momoyo Enyama, Akira Ikegami | 2024-10-22 |
| 12057288 | Charged particle beam device and inspection method | Momoyo Enyama, Makoto Sakakibara | 2024-08-06 |
| 11967482 | Charged particle beam device | Wen Li, Momoyo Enyama, Makoto Sakakibara | 2024-04-23 |
| 11961701 | Charged particle beam device and operation method therefor | Tomoharu NAGASHIMA, Kazuki Ikeda, Wen Li, Masashi Wada | 2024-04-16 |
| 11798780 | Charged particle beam device | Toshiyuki Yokosuka, Chahn Lee, Hideyuki Kazumi, Shahedul Hoque, Kumiko Shimizu +1 more | 2023-10-24 |
| 11508544 | Thermoelectric field emission electron source and electron beam application device | Soichiro Matsunaga, Souichi Katagiri, Keigo Kasuya, Aki Takei, Takashi Doi | 2022-11-22 |
| 11443914 | Charged-particle beam device and cross-sectional shape estimation program | Toshiyuki Yokosuka, Kouichi Kurosawa, Hideyuki Kazumi | 2022-09-13 |
| 11239052 | Charged particle beam device | Toshiyuki Yokosuka, Chahn Lee, Hideyuki Kazumi, Shahedul Hoque, Kumiko Shimizu +1 more | 2022-02-01 |
| 11227740 | Electron gun and electron beam application device | Soichiro Matsunaga, Yasunari Sohda, Souichi Katagiri, Makoto Sakakibara, Takashi Doi | 2022-01-18 |
| 11133147 | Charged particle ray device and cross-sectional shape estimation program | Toshiyuki Yokosuka, Kouichi Kurosawa, Hideyuki Kazumi, Chahn Lee | 2021-09-28 |
| 11062892 | Charged particle detector including a light-emitting section having lamination structure, charged particle beam device, and mass spectrometer | Shin Imamura, Takashi Ohshima, Tomonobu Tsuchiya, Makoto Suzuki | 2021-07-13 |
| 10984981 | Charged particle beam device having inspection scan direction based on scan with smaller dose | Hideki ITAI, Kumiko Shimizu, Wataru MORI, Shahedul Hoque | 2021-04-20 |
| 10984979 | Charged particle detector and charged particle beam apparatus | Shin Imamura, Takashi Ohshima, Tomonobu Tsuchiya, Shahedul Hoque, Shunsuke Mizutani +1 more | 2021-04-20 |
| 10903037 | Charged particle beam device | Keigo Kasuya, Shuhei Ishikawa, Kenji Tanimoto, Hideo Todokoro, Souichi Katagiri +2 more | 2021-01-26 |
| 10818470 | Charged particle beam device | Kazuki Ikeda, Wen Li, Takuma Nishimoto, Hiroyuki Takahashi, Wataru MORI +1 more | 2020-10-27 |
| 10796880 | Charged particle beam device and charged particle beam device noise source determination method | Takuma Nishimoto, Wen Li, Hiroyuki Takahashi, Wataru MORI | 2020-10-06 |
| 10720306 | Charged particle beam device | Toshiyuki Yokosuka, Chahn Lee, Hideyuki Kazumi, Shahedul Hoque, Kumiko Shimizu +1 more | 2020-07-21 |
| 10707047 | Measuring device and measuring method | Noritsugu Takahashi, Makoto Sakakibara, Wataru MORI, Yuko Sasaki | 2020-07-07 |
| 10692687 | Measurement and inspection device | Wen Li, Shinichi Murakami, Hiroyuki Takahashi, Yuko Sasaki, Minoru Yamazaki | 2020-06-23 |
| 10679821 | Light guide, detector having light guide, and charged particle beam device | Yoshifumi Sekiguchi, Shin Imamura, Shahedul Hoque | 2020-06-09 |
| 10593512 | Light guide, detector having light guide, and charged particle beam device | Yoshifumi Sekiguchi, Shin Imamura, Shahedul Hoque | 2020-03-17 |
| 10559447 | Charged particle beam device with transient signal correction during beam blanking | Ryo Kadoi, Wen Li, Kazuki Ikeda, Hiroyuki Takahashi | 2020-02-11 |