Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11443914 | Charged-particle beam device and cross-sectional shape estimation program | Toshiyuki Yokosuka, Hajime Kawano, Hideyuki Kazumi | 2022-09-13 |
| 11133147 | Charged particle ray device and cross-sectional shape estimation program | Toshiyuki Yokosuka, Hajime Kawano, Hideyuki Kazumi, Chahn Lee | 2021-09-28 |
| 10964508 | Charged-particle beam device | Yuzuru Mizuhara | 2021-03-30 |
| 10541103 | Charged particle beam device | Yuzuru Mizuhara, Toshiyuki Yokosuka, Hideyuki Kazumi, Kenichi Myochin | 2020-01-21 |
| 9753017 | Ultrasonic observation equipment, ultrasonic observation system, and ultrasonic observation method | Naoyuki Kono, So KITAZAWA, Yuji Matsui | 2017-09-05 |
| 8776565 | Evaluation method of residual stress in water jet peening and method of executing water jet peening | Hisamitu Hatou, Noboru Saitou, Fujio Yoshikubo, Yuji Matsui, Masashi Fukaya | 2014-07-15 |
| 8387427 | Water jet peening method and apparatus thereof | Yuji Matsui, Masahiro Tooma, Atsushi Baba, Fujio Yoshikubo | 2013-03-05 |
| 8040146 | Inspection apparatus having a heating mechanism for performing sample temperature regulation | Takeshi Sunaoshi, Takeshi Sato, Masaaki Komori | 2011-10-18 |
| 7663390 | Inspection apparatus and method | Takeshi Sunaoshi, Takeshi Sato, Masaaki Komori | 2010-02-16 |
| 7081625 | Charged particle beam apparatus | Masanari Furiki, Takehiko Konno, Ryuichi Funatsu | 2006-07-25 |
| 6972405 | Nanoscale standard sample and its manufacturing method | Yasuhira Nagakubo, Mitsuhiko Yamada | 2005-12-06 |
| 6636579 | Device and method for repairing inside of reactor pressure vessel | Youichi Mahara, Toshiharu Nagashima, Kazuhiro Nitta, Shinji Go, Yoshitoshi Suzuki +1 more | 2003-10-21 |
| 5322919 | Process for producing a polycarbonate in inert solvent | Shigeki Kuze, Noriyuki Kunishi, Masaya Okamoto | 1994-06-21 |