Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11177109 | Specimen holder and charged particle beam device provided with same | Toshie Yaguchi | 2021-11-16 |
| 10658150 | Cryostation system | Toshiyuki Iwahori | 2020-05-19 |
| 10204761 | Charged particle beam device, electron microscope and sample observation method | Takeshi Sunaoshi, Kazutaka Nimura | 2019-02-12 |
| 10083814 | Electron microscope and sample observation method | Isao Nagaoki, Toshiyuki Oyagi, Hiroaki Matsumoto, Kiyotaka Nakano, Takeshi Sato | 2018-09-25 |
| 10068745 | Charged particle beam device and sample holder for charged particle beam device | Toshie Yaguchi, Toshiyuki Iwahori | 2018-09-04 |
| 9721752 | Sample holder and charged particle device | Isao Nagaoki, Hiroaki Matsumoto, Takeshi Sato | 2017-08-01 |
| 9558910 | Sample holder for electron microscope | Shohei Terada, Yoshifumi Taniguchi | 2017-01-31 |
| 9543112 | Specimen cryo holder and dewar | Takashi Mizuo | 2017-01-10 |
| 9449786 | Charged particle radiation device and specimen preparation method using said device | Miki Tsuchiya, Satoshi Tomimatsu | 2016-09-20 |
| 9378922 | Electron microscope and electron microscope sample retaining device | Toshie Yaguchi | 2016-06-28 |
| 9099281 | Charged particle radiation apparatus, and method for displaying three-dimensional information in charged particle radiation apparatus | Toshie Yaguchi, Junzo Azuma, Akira Watabe | 2015-08-04 |
| 8878144 | Electron microscope and sample holder | Toshie Yaguchi, Akira Watabe | 2014-11-04 |
| 8853648 | Sample holder, method for use of the sample holder, and charged particle device | Toshiaki Tanigaki, Katsuji Ito | 2014-10-07 |
| 8729497 | Sample device for charged particle beam | Toshiaki Tanigaki, Hideki Hirota, Katsuji Ito, Takayuki Asakawa | 2014-05-20 |
| 8604429 | Electron beam device and sample holding device for electron beam device | Toshie Yaguchi, Takeo Kamino, Akira Watabe | 2013-12-10 |
| D660335 | Fixation device for a sample case for an electron microscope | Toshiaki Tanigaki, Hideki Hirota, Takayuki Asakawa, Katsuji Itou | 2012-05-22 |
| D651226 | Sample case for an electron microscope | Toshiaki Tanigaki, Hideki Hirota, Takayuki Asakawa, Katsuji Itou | 2011-12-27 |
| 7700927 | Heating stage for a micro-sample | Toshiaki Tanigaki, Katsuji Itou, Takashi Kanemura, Takayuki Asakawa | 2010-04-20 |
| 6972405 | Nanoscale standard sample and its manufacturing method | Mitsuhiko Yamada, Kouichi Kurosawa | 2005-12-06 |