Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12198892 | Sample holder and charged particle beam apparatus | Shigeru Haneda | 2025-01-14 |
| 11600463 | Cross-section observation device, and control method | Xin Man | 2023-03-07 |
| 9099281 | Charged particle radiation apparatus, and method for displaying three-dimensional information in charged particle radiation apparatus | Toshie Yaguchi, Yasuhira Nagakubo, Akira Watabe | 2015-08-04 |
| 8442300 | Specified position identifying method and specified position measuring apparatus | Ruriko Tsuneta, Tohru Ando | 2013-05-14 |
| 8399863 | Charged particle beam apparatus using an electrostatic lens gun | Hiroyasu Kaga, Masashi Sasaki | 2013-03-19 |
| 7301146 | Probe driving method, and probe apparatus | Satoshi Tomimatsu, Hidemi Koike, Tohru Ishitani, Aritoshi Sugimoto, Yuichi Hamamura +2 more | 2007-11-27 |
| 6970004 | Apparatus for inspecting defects of devices and method of inspecting defects | Tohru Ishitani, Hidemi Koike, Aritoshi Sugimoto, Isamu Sekihara, Kaoru Umemura +1 more | 2005-11-29 |
| 6960765 | Probe driving method, and probe apparatus | Satoshi Tomimatsu, Hidemi Koike, Tohru Ishitani, Aritoshi Sugimoto, Yuichi Hamamura +2 more | 2005-11-01 |
| 6734687 | Apparatus for detecting defect in device and method of detecting defect | Tohru Ishitani, Hidemi Koike, Aritoshi Sugimoto, Isamu Sekihara, Kaoru Umemura +1 more | 2004-05-11 |