Issued Patents All Time
Showing 1–25 of 81 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10186398 | Sample positioning method and charged particle beam apparatus | Masahiro Kiyohara, Kengo Takeno, Atsushi Uemoto | 2019-01-22 |
| 8796651 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Tohru Ishitani, Hidemi Koike, Eiichi Seya, Mitsuo Tokuda +3 more | 2014-08-05 |
| 8779400 | Ion source, ion beam processing/observation apparatus, charged particle beam apparatus, and method for observing cross section of sample | Hiroyasu Shichi, Satoshi Tomimatsu, Noriyuki Kaneoka, Koji Ishiguro | 2014-07-15 |
| 8618520 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Hidemi Koike, Satoshi Tomimatsu +2 more | 2013-12-31 |
| 8569719 | Method and apparatus for specimen fabrication | Satoshi Tomimatsu, Yuichi Madokoro, Yoshimi Kawanami, Yasunori Doi | 2013-10-29 |
| 8525537 | Method and apparatus for probe contacting | Kazuhiro Morita | 2013-09-03 |
| 8481980 | Ion source, ion beam processing/observation apparatus, charged particle beam apparatus, and method for observing cross section of sample | Hiroyasu Shichi, Satoshi Tomimatsu, Noriyuki Kaneoka, Koji Ishiguro | 2013-07-09 |
| 8431891 | Dual beam apparatus with tilting sample stage | Hiroyasu Shichi, Satoshi Tomimatsu, Noriyuki Kaneoka, Koji Ishiguro | 2013-04-30 |
| 8405053 | Method and apparatus for specimen fabrication | Satoshi Tomimatsu, Yuichi Madokoro, Yoshimi Kawanami, Yasunori Doi | 2013-03-26 |
| 8222618 | Method and apparatus for processing a microsample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Hidemi Koike, Satoshi Tomimatsu +2 more | 2012-07-17 |
| 7999240 | Method and apparatus for specimen fabrication | Satoshi Tomimatsu, Yuichi Madokoro, Yoshimi Kawanami, Yasunori Doi | 2011-08-16 |
| 7897936 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Tohru Ishitani, Hidemi Koike, Eiichi Seya, Mitsuo Tokuda +3 more | 2011-03-01 |
| 7888639 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Hidemi Koike, Satoshi Tomimatsu +2 more | 2011-02-15 |
| 7804073 | Liquid metal ion gun | Hiroyasu Kaga, Yuichi Madokoro, Shigeru Izawa, Tohru Ishitani | 2010-09-28 |
| 7791050 | Method and apparatus for specimen fabrication | Satoshi Tomimatsu, Yuichi Madokoro, Yoshimi Kawanami, Yasunori Doi | 2010-09-07 |
| 7777183 | Charge particle beam system, sample processing method, and semiconductor inspection system | Noriyuki Kaneoka, Koji Ishiguro | 2010-08-17 |
| 7733589 | Alternate cylinder table to improve adjacent track interference problem | Toshiaki Wada, Kazunari Tsuchimoto | 2010-06-08 |
| 7725278 | Method for failure analysis and system for failure analysis | Satoshi Tomimatsu, Hiroyasu Shichi, Muneyuki Fukuda | 2010-05-25 |
| 7709062 | Refilling method by ion beam, instrument for fabrication and observation by ion beam, and manufacturing method of electronic device | Hiroyasu Shichi, Muneyuki Fukuda, Isamu Sekihara, Satoshi Tomimatsu | 2010-05-04 |
| 7700931 | Ion beam processing apparatus | Hiroyasu Shichi, Satoshi Tomimatsu, Noriyuki Kaneoka, Koji Ishiguro | 2010-04-20 |
| 7696496 | Apparatus for ion beam fabrication | Satoshi Tomimatsu, Hiroyasu Shichi, Noriyuki Kaneoka, Koji Ishiguro | 2010-04-13 |
| 7661187 | Manufacturing method for magnetic disk drive | Masato Taniguchi, Michio Nakajima | 2010-02-16 |
| 7645983 | Ion source and mass spectrometer instrument using the same | Atsumu Hirabayashi, Minoru Sakairi, Yasuaki Takada, Hideaki Koizumi | 2010-01-12 |
| 7592606 | Manufacturing equipment using ION beam or electron beam | Koji Ishiguro, Noriyuki Kaneoka | 2009-09-22 |
| 7550750 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Hidemi Koike, Satoshi Tomimatsu +2 more | 2009-06-23 |