Issued Patents All Time
Showing 1–25 of 70 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11776800 | Substance analyzer and substance analysis method | Shun KUMANO, Masuyuki Sugiyama, Tsukasa Shishika, Shinji Yoshioka, Akimasa Osaka | 2023-10-03 |
| 10989632 | Method for preparing standard sample for gas flow type analysis system | Shun KUMANO, Masuyuki Sugiyama, Hisashi Nagano, Tatsuo Nojiri, Hiroki Mizuno +1 more | 2021-04-27 |
| 10048172 | Substance-testing apparatus, substance-testing system, and substance-testing method | Masakazu Sugaya, Hideo Kashima, Koichi Terada, Hisashi Nagano | 2018-08-14 |
| 9850696 | Microparticle detection device and security gate | Masakazu Sugaya, Koichi Terada, Hideo Kashima, Hisashi Nagano | 2017-12-26 |
| 9696288 | Attached matter testing device and testing method | Hideo Kashima, Masakazu Sugaya, Koichi Terada, Yasunori Doi, Yasutaka Suzuki +2 more | 2017-07-04 |
| 9423388 | Particle analyzing device | Koichi Terada, Masakazu Sugaya, Hideo Kashima, Hisashi Nagano, Hiromi Satou | 2016-08-23 |
| 9417163 | Analyzer for substance | Hisashi Nagano, Yuichiro Hashimoto, Masakazu Sugaya, Hideo Kashima, Koichi Terada +1 more | 2016-08-16 |
| 9261437 | Attached matter inspection device | Hideo Kashima, Masakazu Sugaya, Koichi Terada, Yasutaka Suzuki, Hisashi Nagano +1 more | 2016-02-16 |
| 8835834 | Mass spectrometer and mass spectrometry method | Masuyuki Sugiyama, Yuichiro Hashimoto, Hisashi Nagano, Hideki Hasegawa, Masuyoshi Yamada | 2014-09-16 |
| 8586916 | Adhering matter inspection equipment and method for inspecting adhering matter | Hideo Kashima, Izumi Waki | 2013-11-19 |
| 8560249 | Dangerous substance detection system | Hisashi Nagano, Minoru Sakairi, Yuichiro Hashimoto, Masuyuki Sugiyama | 2013-10-15 |
| 8284051 | Security system, security center apparatus, and security management method | Hisashi Nagano | 2012-10-09 |
| 8217339 | Adhering matter inspection equipment and method for inspecting adhering method | Hideo Kashima, Izumi Waki | 2012-07-10 |
| 8164053 | Mass analyzer and mass analyzing method | Masuyuki Sugiyama, Yuichiro Hashimoto, Hideki Hasegawa | 2012-04-24 |
| 8044349 | Mass spectrometer | Hiroyuki Satake, Yuichiro Hashimoto | 2011-10-25 |
| 7956322 | Mass spectrometer and mass spectrometric analysis method | Masuyuki Sugiyama, Yuichiro Hashimoto, Hideki Hasegawa | 2011-06-07 |
| 7829848 | Gas monitoring apparatus | Masao Suga, Hisashi Nagano, Izumi Waki, Hidehiro Okada, Tatsuo Nojiri +4 more | 2010-11-09 |
| 7829846 | Analytical system and method utilizing the dependence of signal intensity on matrix component concentration | Yuichiro Hashimoto, Hideki Hasegawa, Masuyuki Sugiyama | 2010-11-09 |
| 7820965 | Apparatus for detecting chemical substances and method therefor | Hisashi Nagano, Izumi Waki | 2010-10-26 |
| 7718960 | Ion mobility spectrometer and ion-mobility-spectrometry/mass-spectrometry hybrid spectrometer | Yuichiro Hashimoto, Hideki Hasegawa, Masuyuki Sugiyama | 2010-05-18 |
| 7663098 | Gas monitoring apparatus and gas monitoring method | Yasuo Seto, Isaac Ohsawa, Hiroshi Sekiguchi, Hisashi Maruko, Akihiko Okumura +3 more | 2010-02-16 |
| 7645983 | Ion source and mass spectrometer instrument using the same | Atsumu Hirabayashi, Minoru Sakairi, Hideaki Koizumi, Kaoru Umemura | 2010-01-12 |
| 7449685 | Gas monitoring apparatus | Masao Suga, Hisashi Nagano, Izumi Waki, Hidehiro Okada, Tatsuo Nojiri +4 more | 2008-11-11 |
| 7408153 | Apparatus for detecting chemical substances and method therefor | Hisashi Nagano, Izumi Waki | 2008-08-05 |
| 7397025 | Mass spectrometer | Takashi Baba, Hiroyuki Satake | 2008-07-08 |