Issued Patents All Time
Showing 1–25 of 36 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12354826 | Charged particle beam apparatus | Tomonori Nakano, Yu YAMAZAWA | 2025-07-08 |
| 11769650 | Multistage-connected multipole, multistage multipole unit, and charged particle beam device | Hideto Dohi, Yoshinobu OOTAKA, Masashi Inada, Hideyuki Kazumi | 2023-09-26 |
| 10945684 | Ultrasonic CT device | Yushi Tsubota, Masakazu Sugaya, Takahide Terada, Kenichi Kawabata, Wenjing WU +2 more | 2021-03-16 |
| 10048172 | Substance-testing apparatus, substance-testing system, and substance-testing method | Masakazu Sugaya, Koichi Terada, Yasuaki Takada, Hisashi Nagano | 2018-08-14 |
| 9850696 | Microparticle detection device and security gate | Masakazu Sugaya, Koichi Terada, Yasuaki Takada, Hisashi Nagano | 2017-12-26 |
| 9773640 | Sample holder, charged particle beam apparatus, and observation method | Tomokazu Shimakura, Yoshio Takahashi | 2017-09-26 |
| 9696288 | Attached matter testing device and testing method | Masakazu Sugaya, Koichi Terada, Yasunori Doi, Yasutaka Suzuki, Hisashi Nagano +2 more | 2017-07-04 |
| 9423388 | Particle analyzing device | Koichi Terada, Masakazu Sugaya, Hisashi Nagano, Yasuaki Takada, Hiromi Satou | 2016-08-23 |
| 9417163 | Analyzer for substance | Hisashi Nagano, Yasuaki Takada, Yuichiro Hashimoto, Masakazu Sugaya, Koichi Terada +1 more | 2016-08-16 |
| 9287084 | Aberration corrector and charged particle beam apparatus using the same | Zhaohui Cheng, Hiroaki Baba, Takeyoshi Ohashi, Tomonori Nakano, Kotoko Urano +1 more | 2016-03-15 |
| 9261437 | Attached matter inspection device | Masakazu Sugaya, Koichi Terada, Yasutaka Suzuki, Hisashi Nagano, Yasuaki Takada +1 more | 2016-02-16 |
| 9214324 | Analysis device and analysis method | Hisashi Nagano, Yasutaka Iida, Yuichiro Hashimoto, Masuyuki Sugiyama, Masakazu Sugaya +2 more | 2015-12-15 |
| 9040905 | Analysis device and analysis method | Hisashi Nagano, Yasutaka Suzuki, Yuichiro Hashimoto, Masuyuki Sugiyama, Masakazu Sugaya +2 more | 2015-05-26 |
| 8963102 | Charged particle beam microscope, sample holder for charged particle beam microscope, and charged particle beam microscopy | Ruriko Tsuneta, Hideki Kikuchi | 2015-02-24 |
| 8840496 | Cooling air intake structure for V-belt drive continuously variable transmission | Teruhide Yamanishi, Hirokazu Komuro, Ryuji Tsuchiya, Nobutaka Horii | 2014-09-23 |
| 8796651 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Tohru Ishitani, Hidemi Koike, Kaoru Umemura, Eiichi Seya +3 more | 2014-08-05 |
| 8618520 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Hidemi Koike, Satoshi Tomimatsu +2 more | 2013-12-31 |
| 8586916 | Adhering matter inspection equipment and method for inspecting adhering matter | Yasuaki Takada, Izumi Waki | 2013-11-19 |
| 8222618 | Method and apparatus for processing a microsample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Hidemi Koike, Satoshi Tomimatsu +2 more | 2012-07-17 |
| 8217339 | Adhering matter inspection equipment and method for inspecting adhering method | Yasuaki Takada, Izumi Waki | 2012-07-10 |
| 7897936 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Tohru Ishitani, Hidemi Koike, Kaoru Umemura, Eiichi Seya +3 more | 2011-03-01 |
| 7888639 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Hidemi Koike, Satoshi Tomimatsu +2 more | 2011-02-15 |
| 7550750 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Hidemi Koike, Satoshi Tomimatsu +2 more | 2009-06-23 |
| 7470918 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Hidemi Koike, Satoshi Tomimatsu +2 more | 2008-12-30 |
| 7465945 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Hidemi Koike, Satoshi Tomimatsu +2 more | 2008-12-16 |