Issued Patents All Time
Showing 1–25 of 74 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12400383 | Training method for learning apparatus, and image generation system | Zhaohui Cheng, Yasutaka Toyoda, Hideto Dohi, Hiroya Ohta | 2025-08-26 |
| 12340970 | Charged particle beam device, and method for controlling charged particle beam device | Shingo Hayashi, Zhaohui Cheng, Hideto Dohi | 2025-06-24 |
| 12327708 | Charged particle beam device and aberration correction method | Shingo Hayashi, Hideto Dohi, Zhaohui Cheng | 2025-06-10 |
| 11798780 | Charged particle beam device | Toshiyuki Yokosuka, Chahn Lee, Hajime Kawano, Shahedul Hoque, Kumiko Shimizu +1 more | 2023-10-24 |
| 11769650 | Multistage-connected multipole, multistage multipole unit, and charged particle beam device | Hideto Dohi, Yoshinobu OOTAKA, Masashi Inada, Hideo Kashima | 2023-09-26 |
| 11443914 | Charged-particle beam device and cross-sectional shape estimation program | Toshiyuki Yokosuka, Hajime Kawano, Kouichi Kurosawa | 2022-09-13 |
| 11239052 | Charged particle beam device | Toshiyuki Yokosuka, Chahn Lee, Hajime Kawano, Shahedul Hoque, Kumiko Shimizu +1 more | 2022-02-01 |
| 11211226 | Pattern cross-sectional shape estimation system and program | Toshiyuki Yokosuka, Hirohiko Kitsuki, Daisuke Bizen, Makoto Suzuki, Yusuke Abe +2 more | 2021-12-28 |
| 11133147 | Charged particle ray device and cross-sectional shape estimation program | Toshiyuki Yokosuka, Hajime Kawano, Kouichi Kurosawa, Chahn Lee | 2021-09-28 |
| 11011348 | Scanning electron microscope and sample observation method using scanning electron microscope | Daisuke Bizen, Natsuki Tsuno, Takafumi Miwa, Makoto Sakakibara, Toshiyuki Yokosuka | 2021-05-18 |
| 10727024 | Charged particle beam device and aberration correction method for charged particle beam device | Kotoko Urano, Zhaohui Cheng, Takeyoshi Ohashi | 2020-07-28 |
| 10720306 | Charged particle beam device | Toshiyuki Yokosuka, Chahn Lee, Hajime Kawano, Shahedul Hoque, Kumiko Shimizu +1 more | 2020-07-21 |
| 10541103 | Charged particle beam device | Yuzuru Mizuhara, Toshiyuki Yokosuka, Kouichi Kurosawa, Kenichi Myochin | 2020-01-21 |
| 10446361 | Aberration correction method, aberration correction system, and charged particle beam apparatus | Zhaohui Cheng, Tomonori Nakano, Kotoko Urano, Takeyoshi Ohashi, Yasunari Sohda | 2019-10-15 |
| 10446359 | Charged particle beam device | Toshiyuki Yokosuka, Yuzuru Mizuhara, Hajime Kawano | 2019-10-15 |
| 10304654 | Charged particle beam device | Akira Ikegami, Yuta Kawamoto, Hideto Dohi, Manabu Yano, Yutaka Tandai | 2019-05-28 |
| 10290464 | Charged particle beam device and pattern measurement device | Toshiyuki Yokosuka, Chahn Lee, Manabu Hasegawa | 2019-05-14 |
| 10249474 | Charged particle beam device | Toshiyuki Yokosuka, Chahn Lee, Hajime Kawano, Shahedul Hoque, Kumiko Shimizu +1 more | 2019-04-02 |
| 10229811 | Charged particle beam inclination correction method and charged particle beam device | Yuzuru Mizuhara | 2019-03-12 |
| 10121634 | Charged particle beam device and charged particle beam measurement method | Natsuki Tsuno, Yoshinobu Kimura, Hajime Kawano, Junichiro Tomizawa | 2018-11-06 |
| 10037866 | Charged particle beam apparatus | Momoyo Enyama, Muneyuki Fukuda, Koichi Hamada, Sayaka Tanimoto | 2018-07-31 |
| 10014160 | Scanning electron microscope and method for controlling same | Kaori Shirahata, Daisuke Bizen, Makoto Sakakibara, Yasunari Sohda, Hajime Kawano | 2018-07-03 |
| 9997326 | Charged particle beam device | Hideto Dohi, Akira Ikegami | 2018-06-12 |
| 9786468 | Charged particle beam device | Toshiyuki Yokosuka, Chahn Lee | 2017-10-10 |
| 9704687 | Charged particle beam application device | Momoyo Enyama, Akira Ikegami, Hideto Dohi, Naomasa Suzuki | 2017-07-11 |