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USPTO Patent Rankings Data through Dec 31, 2025
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Shingo Hayashi — 23 Patents

OMOmron: 6 patents #499 of 3,089Top 20%
Ricoh Company: 5 patents #3,665 of 9,818Top 40%
FCFuji Electric Co.: 4 patents #591 of 2,643Top 25%
HHHitachi High-Technologies: 2 patents #1,236 of 1,200Top 105%
ACAqua Co.: 1 patents #20 of 43Top 50%
TIToray Industries: 1 patents #2,000 of 3,690Top 55%
Hitachi: 1 patents #17,777 of 28,497Top 65%
SISintokogio: 1 patents #245 of 455Top 55%
HSHitachi-Lg Data Storage: 1 patents #177 of 294Top 65%
MAMaxell: 1 patents #286 of 437Top 70%
QCQingdao Haier Washing Machine Co.: 1 patents #87 of 190Top 50%
Kyoto, JP: #812 of 11,909 inventorsTop 7%
Overall (All Time): #178,160 of 4,157,543Top 5%
23 Patents All Time
Shingo Hayashi has been granted 23 US patents while listed as an inventor at Omron. The first was granted in 2013 and the most recent in August 2025. Shingo Hayashi ranks #178,160 of 4,157,543 US inventors in our database (top 4.3%). Patent records list Shingo Hayashi in Kyoto, JP.

Issued Patents All Time

Showing 1–23 of 23 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
12379325 External appearance inspection apparatus and external appearance inspection method Daisuke Konishi 2025-08-05
12372897 Image forming apparatus, image forming method, and printed material Saki TAJIMA, Jun Hitosugi, Kazumi Suzuki, Keiko Kajimura, Norio Kudoh +2 more 2025-07-29
12349451 Silicon carbide semiconductor device and method of manufacturing silicon carbide semiconductor device — 2025-07-01
12340970 Charged particle beam device, and method for controlling charged particle beam device Hideyuki Kazumi, Zhaohui Cheng, Hideto Dohi 2025-06-24
12326835 File management system and work support system Takahiro Matsuda, Shoji Yamamoto, Takuya NAKAMICHI, Takaaki UENO, Masahiko NIIOKA +1 more 2025-06-10
12327708 Charged particle beam device and aberration correction method Hideto Dohi, Zhaohui Cheng, Hideyuki Kazumi 2025-06-10
12132083 Silicon carbide semiconductor device Akimasa Kinoshita 2024-10-29
12072180 Measurement method for amount of deviation, and measurement apparatus Beiping Jin 2024-08-27 $340,000
11936985 Appearance inspection device and defect inspection method Daisuke Konishi 2024-03-19 $163,000
11742392 Silicon carbide semiconductor device and method of manufacturing silicon carbide semiconductor device Takumi Fujimoto 2023-08-29
11721756 Semiconductor device Yoshihito ICHIKAWA, Akimasa Kinoshita 2023-08-08
11709050 Position measurement method using a calibration plate to correct a detection value from the position detector Akihisa Matsuyama 2023-07-25 $187,000
11333535 Method for correcting values detected by linear scales Keita Ebisawa 2022-05-17 $131,000
11035064 Washing and drying machine Yuka Yoshida 2021-06-15
10805552 Visual inspection device and illumination condition setting method of visual inspection device — 2020-10-13
10512861 Electret fiber sheet Yuji Iyama, Takuji Kobayashi 2019-12-24
10365490 Head-mounted display, head-up display and picture displaying method Satoshi Ouchi, Yoshiho Seo, Tomoto Kawamura, Seiji Murata, Takahiro Matsuda +1 more 2019-07-30
10078236 Dimmer and video display device using the same Satoshi Ouchi, Yoshiho Seo, Tomoto Kawamura, Seiji Murata, Takahiro Matsuda +1 more 2018-09-18
9840760 Powder made of iron-base metallic glass Yasushi KINO, Takuya Harada 2017-12-12
8820734 Loading device for recording media, control method thereof, and recording medium Takahiro Miyakawa, Koichi Suse, Osamu Kizaki 2014-09-02
8508803 Image reading apparatus and image reading method including a dividing unit that divides image data into vertical-streak-correction subject data — 2013-08-13
8432583 Image forming apparatus — 2013-04-30
8345077 Write device, image forming apparatus, and open/close control method — 2013-01-01

Nearby-Ranked Inventors

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Amit Kaistha23
Stéphane BOUTINON23
Feras Hantash23
Philip Verhaelen23
Florian Paul Christian Binder23
Jean-Luc Bouthemy23
Egbert Lenderink23
Tony J. Branham23