SH

Shingo Hayashi

OM Omron: 6 patents #499 of 3,089Top 20%
Ricoh Company: 5 patents #3,664 of 9,818Top 40%
FC Fuji Electric Co.: 4 patents #580 of 2,643Top 25%
HH Hitachi High-Technologies: 2 patents #456 of 1,200Top 40%
MA Maxell: 1 patents #286 of 437Top 70%
HS Hitachi-Lg Data Storage: 1 patents #177 of 294Top 65%
QC Qingdao Haier Washing Machine Co.: 1 patents #87 of 190Top 50%
HI Hitachi: 1 patents #17,742 of 28,497Top 65%
SI Sintokogio: 1 patents #245 of 455Top 55%
TI Toray Industries: 1 patents #2,000 of 3,690Top 55%
AC Aqua Co.: 1 patents #20 of 43Top 50%
Overall (All Time): #178,900 of 4,157,543Top 5%
23
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12379325 External appearance inspection apparatus and external appearance inspection method Daisuke Konishi 2025-08-05
12372897 Image forming apparatus, image forming method, and printed material Saki TAJIMA, Jun Hitosugi, Kazumi Suzuki, Keiko Kajimura, Norio Kudoh +2 more 2025-07-29
12349451 Silicon carbide semiconductor device and method of manufacturing silicon carbide semiconductor device 2025-07-01
12340970 Charged particle beam device, and method for controlling charged particle beam device Hideyuki Kazumi, Zhaohui Cheng, Hideto Dohi 2025-06-24
12326835 File management system and work support system Takahiro Matsuda, Shoji Yamamoto, Takuya NAKAMICHI, Takaaki UENO, Masahiko NIIOKA +1 more 2025-06-10
12327708 Charged particle beam device and aberration correction method Hideto Dohi, Zhaohui Cheng, Hideyuki Kazumi 2025-06-10
12132083 Silicon carbide semiconductor device Akimasa Kinoshita 2024-10-29
12072180 Measurement method for amount of deviation, and measurement apparatus Beiping Jin 2024-08-27
11936985 Appearance inspection device and defect inspection method Daisuke Konishi 2024-03-19
11742392 Silicon carbide semiconductor device and method of manufacturing silicon carbide semiconductor device Takumi Fujimoto 2023-08-29
11721756 Semiconductor device Yoshihito ICHIKAWA, Akimasa Kinoshita 2023-08-08
11709050 Position measurement method using a calibration plate to correct a detection value from the position detector Akihisa Matsuyama 2023-07-25
11333535 Method for correcting values detected by linear scales Keita Ebisawa 2022-05-17
11035064 Washing and drying machine Yuka Yoshida 2021-06-15
10805552 Visual inspection device and illumination condition setting method of visual inspection device 2020-10-13
10512861 Electret fiber sheet Yuji Iyama, Takuji Kobayashi 2019-12-24
10365490 Head-mounted display, head-up display and picture displaying method Satoshi Ouchi, Yoshiho Seo, Tomoto Kawamura, Seiji Murata, Takahiro Matsuda +1 more 2019-07-30
10078236 Dimmer and video display device using the same Satoshi Ouchi, Yoshiho Seo, Tomoto Kawamura, Seiji Murata, Takahiro Matsuda +1 more 2018-09-18
9840760 Powder made of iron-base metallic glass Yasushi KINO, Takuya Harada 2017-12-12
8820734 Loading device for recording media, control method thereof, and recording medium Takahiro Miyakawa, Koichi Suse, Osamu Kizaki 2014-09-02
8508803 Image reading apparatus and image reading method including a dividing unit that divides image data into vertical-streak-correction subject data 2013-08-13
8432583 Image forming apparatus 2013-04-30
8345077 Write device, image forming apparatus, and open/close control method 2013-01-01