Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12072180 | Measurement method for amount of deviation, and measurement apparatus | Shingo Hayashi | 2024-08-27 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12072180 | Measurement method for amount of deviation, and measurement apparatus | Shingo Hayashi | 2024-08-27 |