Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10304654 | Charged particle beam device | Akira Ikegami, Yuta Kawamoto, Hideto Dohi, Manabu Yano, Hideyuki Kazumi | 2019-05-28 |
| 10074511 | Defect image classification apparatus | Takehiro Hirai, Yohei Minekawa | 2018-09-11 |
| 9881365 | Semiconductor defect categorization device and program for semiconductor defect categorization device | — | 2018-01-30 |
| 8995748 | Defect image processing apparatus, defect image processing method, semiconductor defect classifying apparatus, and semiconductor defect classifying method | Tsunehiro Sakai, Shigeki Kurihara, Tamao Ishikawa, Yuichi Hamamura, Tomohiro Funakoshi +2 more | 2015-03-31 |
| 8595666 | Semiconductor defect classifying method, semiconductor defect classifying apparatus, and semiconductor defect classifying program | Koichi Hayakawa, Takehiro Hirai, Tamao Ishikawa, Tsunehiro Sakai, Kazuhisa Hasumi +3 more | 2013-11-26 |
| 8139845 | Evaluation object pattern determining apparatus, evaluation object pattern determining method, evaluation object pattern determining program and pattern evaluating system | Takashi Noguchi, Shigetoshi Sameshima, Shigeki Kurihara, Tamao Ishikawa | 2012-03-20 |